Zobrazeno 1 - 10
of 81
pro vyhledávání: '"Sergei S. Ostapenko"'
Autor:
L. V. Borkovska, Catherine M. Phelan, Tetyana Kryshtab, T. Stara, Sergei S. Ostapenko, Ganna Chornokur, O.F. Kolomys, N. Korsunska, V. V. Strelchuk
Publikováno v:
MRS Proceedings. 1617:157-162
The effect of bio-conjugation of CdSe/ZnS core-shell quantum dots (QDs) with Interleukin 10 (IL-10) antibodies on the aging of photoluminescence (PL) spectra of the QDs was investigated. The aging occurred upon storage of QDs for about 2 years or the
Autor:
O.L. Stroyuk, Viktor Strelchuk, Ganna Chornokur, К.Yu. Pechers’ka, L.V. Borkovska, O.F. Kolomys, Sergei S. Ostapenko, C. Phelan, L. P. Germash, N.O. Korsunska, Tetyana Kryshtab
Publikováno v:
Superlattices and Microstructures. 51:353-362
The aging of the photoluminescence (PL) in bio-conjugated and non-conjugated CdSeTe–ZnS core–shell quantum dots (QDs) is studied by the micro-PL, micro-Raman and X-ray diffraction (XRD) in the samples of buffered QD solution dried on a crystallin
Autor:
L. P. Germash, Sergei S. Ostapenko, E. Yu Pecherska, Tetyana Kryshtab, Ganna Chornokur, Nadiia Korsunska, L. V. Borkovska
Publikováno v:
Semiconductors. 43:775-781
The photoluminescence and photoluminescence excitation spectra, the X-ray diffraction patterns, and the effect of conjugation with biomolecules upon these characteristics are studied for silanized CdSe/ZnS quantum dots. Along with the band of annihil
Autor:
Sergei S. Ostapenko, C. Phelan, T. Sellers, Ganna Chornokur, Abraham Wolcott, Tetyana Kryshtab, Jin Z. Zhang, E. Oleynik, Nadiia Korsunska
Publikováno v:
Superlattices and Microstructures. 45:240-248
We report on the application of the bio-conjugated quantum dots (QDs) for a “sandwich” enzyme-linked immunosorbent assay (ELISA) cancer testing technique. Quantum dot ELISA detection of the cancer PSA antigen at concentrations as low as 0.01 ng/m
Autor:
K.M. Kouchkarov, E. Sánchez-Meza, B. Ikramov, Elias K. Stefanakos, M. Dybjec, Sergei S. Ostapenko, Yu. V. Vorobiev, Gerardo Contreras-Puente, Xavier Mathew, T. M. Razykov, A. Hubbimov, Don L. Morel, Chris Ferekides, Osvaldo Vigil-Galán, B. A. Ergashev, Yu. Emirov, Hari M. Upadhyaya, Ganna Chornokur
Publikováno v:
Solar Energy. 83:90-93
CdTe films with different compositions (Cd-rich, Te-rich and stoichiometric) were fabricated by a novel and low cost chemical molecular beam deposition method (CMBD) in atmospheric pressure hydrogen flow. Cd and Te granules were used as precursors. T
Publikováno v:
Applied Acoustics. 69:755-760
This paper presents acoustic measurements obtained by mechanically exciting vibratory modes in single-crystalline silicon wafers with hairline periphery cracks of different type and location. The data presented shows a dependence of natural frequenci
Autor:
Georgiy Polupan, Tetyana Torchynska, Sergei S. Ostapenko, M. Morales Rodriguez, A.I. Diaz Cano
Publikováno v:
Journal of Non-Crystalline Solids. 354:2272-2275
The paper presents the results of porous SiC study using photoluminescence and scanning electronic microscopy. It is shown that the intensity of defect-related PL bands (2.08, 2.27, 2.44 and 2.63 eV) increases monotonically with the rise of PSiC thic
Autor:
Tetyana Torchynska, Kevin J. Malloy, Sergei S. Ostapenko, R. Peña Sierra, Andreas Stintz, Petr G. Eliseev, E. Velázquez Lozada, M. Dybiec
Publikováno v:
International Journal of Nanoscience. :383-387
This paper presents the photoluminescence study at 12 K and scanning photoluminescence spectroscopy investigation of the ground and excited states at 80 and 300 K on InAs QDs inserted in In 0.15 Ga 0.85 As / GaAs QW structures and created at differen
Publikováno v:
Measurement Science and Technology. 18:852-858
The resonance ultrasonic vibrations (RUV) technique is adapted for non-destructive crack detection in full-size silicon wafers for solar cells. The RUV methodology relies on deviation of the frequency response curve of a wafer, ultrasonically stimula
Publikováno v:
Applied Acoustics. 67:541-549
This paper presents audible vibratory mode data obtained by mechanically exciting acoustic modes in multi-crystalline silicon wafers with various levels and distributions of residual stress. Natural frequency data from the silicon wafers is found to