Zobrazeno 1 - 10
of 13
pro vyhledávání: '"Serge De Paoli"'
Autor:
Ali Jouni, Mathieu Sicre, Victor Malherbe, Bastien Mamdy, Thomas Thery, Jean-Marc Belloir, Dimitri Soussan, Serge De Paoli, Vincent Lorquet, Valérian Lalucaa, Cédric Virmontois, Gilles Gasiot, Vincent Goiffon
Publikováno v:
IEEE Transactions on Nuclear Science. 70:515-522
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d8228cd5402b1370fd8d311523a669d7
https://doi.org/10.1109/tns.2023.3248521
https://doi.org/10.1109/tns.2023.3248521
Autor:
Jean-Luc Autran, Valerie Bertin, Calogero Timineri, Capucine Lecat-Mathieu de Boissac, Jean-Marc Daveau, Serge De-Paoli, Gilles Gasiot, Anna Asquini, Fady Abouzeid, Victor Malherbe, Philippe Roche
Publikováno v:
IEEE Transactions on Nuclear Science. 68:1040-1044
This article presents a radiation-hardened Cortex-R4F system-on-chip prototype with integrated total ionizing dose (TID) dynamic compensation capabilities, designed and fabricated in 28-nm fully depleted silicon-on-insulator (FD-SOI) technology. The
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c40c8c08651ff67091e560d937096b9e
https://doi.org/10.1109/tns.2021.3071199
https://doi.org/10.1109/tns.2021.3071199
Publikováno v:
IEEE Transactions on Nuclear Science. 68:777-784
We report on alpha and neutron irradiation of 7.8 $\boldsymbol {\mu }\text{m}$ single-photon avalanche diodes (SPADs) manufactured in 40-nm CMOS. Displacement damage leads to persistent dark count rate hot spots, due to carrier generation centers int
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a98eeef42ffa6868f3869fa745262dbd
https://doi.org/10.1109/tns.2021.3071171
https://doi.org/10.1109/tns.2021.3071171
Autor:
Victor Malherbe, Francois Roy, Olivier Nier, Thomas Dalleau, Serge De Paoli, Philippe Roche, Jean-Luc Autran, Martin Dentan, Guo-Neng Lu
Publikováno v:
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, 2022, 69 (3), pp.534-541. ⟨10.1109/TNS.2022.3148925⟩
IEEE Transactions on Nuclear Science, 2022, 69 (3), pp.534-541. ⟨10.1109/TNS.2022.3148925⟩
International audience
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f9935f2012cc61167465771d0110e3d5
https://hal.science/hal-04138209
https://hal.science/hal-04138209
Autor:
Ali Jouni, Victor Malherbe, Bastien Mamdy, Thomas Thery, Mathieu Sicre, Dimitri Soussan, Vincent Lorquet, Serge De Paoli, Jean-Marc Belloir, Valerian Lalucaa, Cedric Virmontois, Gilles Gasiot, Vincent Goiffon
Publikováno v:
IEEE Transactions on Nuclear Science. :1-1
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6915eb181e9dee7dd4e01e46335a9e29
https://doi.org/10.1109/tns.2023.3257740
https://doi.org/10.1109/tns.2023.3257740
Autor:
Jean-Marc Daveau, Olivier Romain, Valerie Bertin, Fakhreddine Ghaffari, Sebastien Thomet, Serge De-Paoli, Philippe Roche, Fady Abouzeid
Publikováno v:
DFT
With the rise of the use of CPU-based Systems on a Chip (SoCs) in critical applications, the need to comply with harsh environments such as radiations or environmental fluctuation of parameters where they will evolve is essential. Devices must be qua
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2ac1c02558526e680f3bd0280693ba04
https://doi.org/10.1109/dft52944.2021.9568317
https://doi.org/10.1109/dft52944.2021.9568317
Autor:
Sébastien Thomet, Fakhreddine Ghaffari, Serge De Paoli, Jean-Marc Daveau, Fady Abouzeid, Olivier Romain
Publikováno v:
Microelectronics Reliability. 137:114667
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b6ef3806f936edec5297f5245c478028
https://doi.org/10.1016/j.microrel.2022.114667
https://doi.org/10.1016/j.microrel.2022.114667
Autor:
Sebastien Thomet, Serge De Paoli, Fakhreddine Ghaffari, Fady Abouzeid, Olivier Romain, Philippe Roche
Publikováno v:
2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9507e5e220c53d5e9d10cc7cef3d380b
https://doi.org/10.1109/radecs47380.2019.9745655
https://doi.org/10.1109/radecs47380.2019.9745655
Autor:
Albrecht Mayer, Serge De Paoli, Jan Stuyt, Wido Kruijtzer, Pieter van der Wolf, Emmanuel Vaumorin, Wolfgang Ecker, Erwin de Kock, Christophe Amerijckx, Serge Hustin
Publikováno v:
DATE
Effective integration of advanced systems-on-chip (SoC) requires extensive reuse of IP modules as well as automation of the IP integration process, including verification. Key enablers for this are standards to describe and package IP modules. We foc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3099c5e90d579584417432ddc4cfa716
https://doi.org/10.1109/date.2008.4484656
https://doi.org/10.1109/date.2008.4484656
Publikováno v:
Computational Science – ICCS 2006 ISBN: 9783540343851
International Conference on Computational Science (4)
International Conference on Computational Science (4)
This paper describes a dynamic scheduling technique based on work-stealing that is proved to be efficient on SMP and clusters. We apply this technique in the MPSoC field, using a simulation in SystemC. We experiment on a MPEG-4 encoding application a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8a86fef36876ac0c3bc92cad87d57d5d
https://doi.org/10.1007/11758549_133
https://doi.org/10.1007/11758549_133