Zobrazeno 1 - 10
of 78
pro vyhledávání: '"Sequeira, A.D."'
Publikováno v:
AIAA SciTech Forum 2023
The present work details the steady and unsteady flow topology in the vicinity of an array of periodically spaced super-critical (i.e. causing flow tripping) discrete roughness elements (DRE) applied in a swept wing boundary layer. The stationary flo
Autor:
Leitão, J.P. *, Fonseca, A., Sobolev, N.A., Carmo, M.C., Franco, N., Sequeira, A.D., Burbaev, T.M., Kurbatov, V.A., Rzaev, M.M., Pogosov, A.O., Sibeldin, N.N., Tsvetkov, V.A., Lichtenberger, H., Schäffler, F.
Publikováno v:
In Materials Science in Semiconductor Processing 2005 8(1):35-39
Autor:
Barradas, N.P., Matias, V., Sequeira, A.D., Soares, J.C., Kreissig, U., Wang, J.U., Freitas, P.P.
Publikováno v:
In Nuclear Inst. and Methods in Physics Research, B 2004 219:742-746
Autor:
Pereira, S *, Correia, M.R, Pereira, E, O'Donnell, K.P, Martin, R.W, White, M.E, Alves, E, Sequeira, A.D, Franco, N
Publikováno v:
In Materials Science & Engineering B 2002 93(1):163-167
Autor:
Chtcherbatchev, K.D., Sequeira, A.D. *, Franco, N., Barradas, N.P., Myronov, M., Mironov, O.A., Parker, E.H.C.
Publikováno v:
In Materials Science & Engineering B 2002 91:453-456
Publikováno v:
In Surface & Coatings Technology 2002 158:328-333
Autor:
Ribeiro Carrott, M.M.L, Candeias, A.J.E, Carrott, P.J.M, Ravikovitch, P.I, Neimark, A.V, Sequeira, A.D
Publikováno v:
In Microporous and Mesoporous Materials 2001 47(2):323-337
Autor:
Pereira, S., Correia, M.R., Pereira, E., O'Donnell, K.P., Alves, E., Barradas, N.P., Sequeira, A.D., Franco, N., Watson, I.M., Liu, C.
Publikováno v:
Physica Status Solidi (C); 2003, Vol. 0 Issue 1, p302-306, 5p
Autor:
Correia, M.R., Pereira, S., Frandon, J., Renucci, M.A., Alves, E., Sequeira, A.D., Franco, N.
Publikováno v:
Physica Status Solidi (C); 2003, Vol. 0 Issue 1, p563-567, 5p
Autor:
Chtcherbatchev, K.D.1 chterb@girmet.ru, Sequeira, A.D.2 sequeira@itn.pt, Franco, N.2, Barradas, N.P.2, Myronov, M.3, Mironov, O.A.3, Parker, E.H.C.3
Publikováno v:
Materials Science & Engineering: B. Apr2002, Vol. 91/92, p453. 4p.