Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Seongjune Kim"'
Publikováno v:
IEEE Access, Vol 11, Pp 141610-141627 (2023)
One of the most critical vulnerabilities in authentication, commonly referred to as “broken authentication,” poses a harmful threat, leading to the compromise of user credentials and the unauthorized hijacking of sessions. Addressing these securi
Externí odkaz:
https://doaj.org/article/958cc4afd26e43a2a2d78ebce835533d
Autor:
Dong-Won Kim, Seung Jib Choi, Young-soo Yang, Jae-Hyun Kim, Sang Jun Choi, Sung-Ki Chae, Tuwon Chang, Hyereun Kim, Seongjune Kim, Jun-Ho Lee, Young-Ho Kim, Tae-Ho Kim
Publikováno v:
Journal of Photopolymer Science and Technology. 23:259-264
Our recent progress on the development of ArF photoresist (PR) for implant layers is reported. Since scum-free patterning is the critical property of an implant PR, a specific focus has been on eliminating scum while maintaining other lithographic pe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1b2c697b319e049404c896127a50eff1
https://doi.org/10.2494/photopolymer.23.259
https://doi.org/10.2494/photopolymer.23.259