Zobrazeno 1 - 10
of 64
pro vyhledávání: '"Seong-Kwang Kim"'
Publikováno v:
Healthcare, Vol 11, Iss 11, p 1583 (2023)
Nurse turnover is a critical issue in Korea, as it affects the quality of patient care and increases the financial burden on healthcare systems. To address this problem, this study aimed to develop and evaluate a machine learning-based prediction mod
Externí odkaz:
https://doaj.org/article/7e30d17af1c64ee9ba5b6032414172c9
Autor:
Sang-Hyeon Kim, Seong-Kwang Kim, Jae-Phil Shim, Dae-Myeong Geum, Gunwu Ju, Han-Sung Kim, Hee-Jeong Lim, Hyeong-Rak Lim, Jae-Hoon Han, Subin Lee, Ho-Sung Kim, Pavlo Bidenko, Chang-Mo Kang, Dong-Seon Lee, Jin-Dong Song, Won Jun Choi, Hyung-Jun Kim
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 6, Pp 579-587 (2018)
Monolithic 3-D integration has emerged as a promising technological solution for traditional transistor scaling limitations and interconnection bottleneck. The challenge we must overcome is a processing temperature limit for top side devices in order
Externí odkaz:
https://doaj.org/article/20293a3a75a24531bcbca730df0a2068
Autor:
Bong Ho Kim, Song‐Hyeon Kuk, Seong Kwang Kim, Joon Pyo Kim, Yoon‐Je Suh, Jaeyong Jeong, Chan Jik Lee, Dae‐Myeong Geum, Young Joon Yoon, Sang Hyeon Kim
Publikováno v:
Advanced Electronic Materials, Vol 10, Iss 1, Pp n/a-n/a (2024)
Abstract The study demonstrates HfZrOx (HZO)‐based Si ferroelectric field‐effect transistors (FeFETs) with a low operating voltage (1.5 V) and immediate read‐after‐write operation (100 ns) via HZO thickness scaling, electron‐beam‐irradiat
Externí odkaz:
https://doaj.org/article/f9b6aae35a3049e9b8b5aadcc75f6987
Autor:
Sang-Hyeon Kim, Ilpyo Roh, Jae-Hoon Han, Dae-Myeong Geum, Seong Kwang Kim, Soo Seok Kang, Hang-Kyu Kang, Woo Chul Lee, Seong Keun Kim, Do Kyung Hwang, Yun Heub Song, Jin Dong Song
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 9, Pp 42-48 (2021)
In this study, we demonstrated low leakage current and high mobility thin body (In)GaSb p-FETs. Through the optimization of the V/III ratio during the epitaxial growth, we achieved a highly insulating bottom Al0.95Ga0.05Sb barrier, which eliminates t
Externí odkaz:
https://doaj.org/article/e14f70b92ca14adebb389839bfcd79c5
Autor:
Bong Ho Kim, Song-Hyeon Kuk, Seong Kwang Kim, Joon Pyo Kim, Yoon-Je Suh, Jaeyong Jeong, Dae-Myeong Geum, Seung-Hyub Baek, Sang Hyeon Kim
Publikováno v:
IEEE Transactions on Electron Devices. 70:1996-2000
Publikováno v:
IEEE Electron Device Letters. 44:598-601
Autor:
Joon Pyo Kim, Seong Kwang Kim, Seohak Park, Song-hyeon Kuk, Taeyoon Kim, Bong Ho Kim, Seong-Hun Ahn, Yong-Hoon Cho, YeonJoo Jeong, Sung-Yool Choi, Sanghyeon Kim
Publikováno v:
Nano Letters. 23:451-461
Autor:
Joon Pyo Kim, Jaeho Sim, Pavlo Bidenko, Dae-Myeong Geum, Seong Kwang Kim, Joonsup Shim, Jongmin Kim, Sanghyeon Kim
Publikováno v:
IEEE Electron Device Letters. 43:1834-1837
Autor:
Bong Ho Kim, Song‐Hyeon Kuk, Seong Kwang Kim, Joon Pyo Kim, Yoon‐Je Suh, Jaeyong Jeong, Dae‐Myeong Geum, Seung‐Hyub Baek, Sang Hyeon Kim
Publikováno v:
Advanced Electronic Materials. 9
Autor:
Bong Ho Kim, Song-hyeon Kuk, Seong Kwang Kim, Joon Pyo Kim, Dae-Myeong Geum, Seung-Hyub Baek, Sang Hyeon Kim
Publikováno v:
Nanoscale Advances. 4:4114-4121
We demonstrate the successful remote oxygen scavenging of HZO-based capacitors, highlighting the significant enhancement of remanent polarization, switching voltage, endurance, and retention.