Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Seong baek Yoon"'
Publikováno v:
Automated Visual Inspection and Machine Vision IV.
In actual industrial sites, the ability of the deep learning model to detect defects at a high speed and reducing the time required to train the model is also a very important issue. In this paper, we propose a fast and accurate deep learning model a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d9ff8adc4692732874ef87419f9dd6ab
https://doi.org/10.1117/12.2592518
https://doi.org/10.1117/12.2592518
Publikováno v:
Automated Visual Inspection and Machine Vision IV.
In this paper, we propose a preprocessing method of exploiting noise and blur for effective noise elimination in data. At present, there are many kinds of research to improve the performance of object classification, detection, and image segmentation
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5792c656b52f34ca65e069a62f10a1e3
https://doi.org/10.1117/12.2592346
https://doi.org/10.1117/12.2592346
Autor:
Beyerer, Jürgen, Heizmann, Michael, Park, Da hyun, Yoon, Seong baek, Kim, Hyun woo, Kim, Hyeong jin, Kim, Yun hyeok, Lee, Hyo jin
Publikováno v:
Proceedings of SPIE; 4/29/2021, Vol. 11787, p117870M-117870M-4, 1p
Effective deep learning training method using blur and noise filter to detect defect in TFT-LCD PAD.
Autor:
Beyerer, Jürgen, Heizmann, Michael, Lee, Jae Gu, Yoon, Yeo Min, Kim, Seon Geol, Ha, Chang Woo, Yoon, Seong Baek, Lee, Hyo Jin
Publikováno v:
Proceedings of SPIE; 4/29/2021, Vol. 11787, p117870I-117870I-5, 1p