Zobrazeno 1 - 10
of 51
pro vyhledávání: '"Seokyoon Shin"'
Autor:
Seungjin Lee, Seokyoon Shin, Giyul Ham, Juhyun Lee, Hyeongsu Choi, Hyunwoo Park, Hyeongtag Jeon
Publikováno v:
AIP Advances, Vol 7, Iss 4, Pp 045307-045307-7 (2017)
Tin disulfide (SnS2) has attracted much attention as a two-dimensional (2D) material. A high-quality, low-temperature process for producing 2D materials is required for future electronic devices. Here, we investigate tin disulfide (SnS2) layers depos
Externí odkaz:
https://doaj.org/article/23b170d29db943b0ad9cd8889542213c
Autor:
Juhyun Lee, Jeongsu Lee, Giyul Ham, Seokyoon Shin, Joohyun Park, Hyeongsu Choi, Seungjin Lee, Juyoung Kim, Onejae Sul, Seungbeck Lee, Hyeongtag Jeon
Publikováno v:
AIP Advances, Vol 7, Iss 2, Pp 025311-025311-6 (2017)
We report the effect of zirconium oxide (ZrO2) layers on the electrical characteristics of multilayered tin disulfide (SnS2) formed by atomic layer deposition (ALD) at low temperatures. SnS2 is a two-dimensional (2D) layered material which exhibits a
Externí odkaz:
https://doaj.org/article/fb17744620934694a2db29097c57153c
Autor:
Changhyun Jin, Seokyoon Shin, Ali Mirzaei, Myung Sik Choi, Hyeongtag Jeon, Wansik Oum, Han Gil Na, Jae Hoon Bang, Hyeong Su Choi, Hyunwoo Park, Namgue Lee, Hyoun Woo Kim, Yeonsik Choi
Publikováno v:
Ceramics International. 45:7723-7729
We report the electrical and optical characteristics of SnO2 thin films irradiated by microwaves (MWs) and grown using atomic layer deposition in a commercial MW oven operating at a frequency of 2.45 GHz. The properties of the MW-irradiated SnO2 thin
Autor:
Hyunjung Kim, Seokyoon Shin, Woochool Jang, Kunyoung Lee, Hyeongtag Jeon, Youngkyun Kweon, Jaemin Lee
Publikováno v:
Thin Solid Films. 645:334-339
The deposition of SiOC thin films via remote plasma atomic layer deposition was investigated. Octamethylcyclotetrasiloxane (OMCTS) and O2, Ar, H2 plasmas were respectively used as a precursor and reactants during the deposition process at 400 °C. Pl
Publikováno v:
Journal of Applied Physics; 2014, Vol. 115 Issue 7, p1-7, 7p, 1 Color Photograph, 1 Black and White Photograph, 4 Diagrams, 1 Chart, 5 Graphs
Autor:
Woochool Jang, Jaewan Chang, Heeyoung Jeon, Hyungtak Seo, Hyoseok Song, Changhee Shin, Seokyoon Shin, Joo Hyun Park, Younsoo Kim, Jae Hyoung Choi, Han-jin Lim, Hyeongtag Jeon
Publikováno v:
Thin Solid Films. 619:317-322
In this study, we report the effect of process conditions on the crystallinity and energy band structure of atomic layer deposition (ALD) ZrO2 films deposited, using tris(dimethylamino) cyclopentadienyl zirconium as a precursor and ozone as a reactan
Publikováno v:
Thin Solid Films. 599:119-124
We investigated the characteristics of 100 nm-thick Al 2 O 3 /ZrO 2 laminated films grown by ozone (O 3 )-based atomic layer deposition (ALD) at low temperature (100 °C) as thin film encapsulation (TFE). Calcium (Ca) test was performed at a relative
Autor:
Hyeongsu Choi, Seokyoon Shin, Yeongtae Choi, Namgue Lee, Hyunwoo Park, Keunsik Kim, Hyeongtag Jeon
Publikováno v:
Journal of Vacuum Science & Technology A. 38:062403
Aluminum oxide films deposited by spatial atomic layer deposition have been used for thin-film encapsulation of organic light-emitting diodes. In this study, a multidensity layer structure consisting of two Al2O3 layers of different densities was dep
Autor:
Hyeongsu, Choi, Jeongsu, Lee, Seokyoon, Shin, Juhyun, Lee, Seungjin, Lee, Hyunwoo, Park, Sejin, Kwon, Namgue, Lee, Minwook, Bang, Seung-Beck, Lee, Hyeongtag, Jeon
Publikováno v:
Nanotechnology. 29(21)
Representative tin sulfide compounds, tin monosulfide (SnS) and tin disulfide (SnS
Autor:
Hyunwoo Park, Giyul Ham, Seokyoon Shin, Hyeongsu Choi, Hyeongtag Jeon, Ju Hyun Lee, Seungjin Lee
Publikováno v:
AIP ADVANCES(7): 4
AIP Advances, Vol 7, Iss 4, Pp 045307-045307-7 (2017)
AIP Advances, Vol 7, Iss 4, Pp 045307-045307-7 (2017)
Tin disulfide (SnS2) has attracted much attention as a two-dimensional (2D) material. A high-quality, low-temperature process for producing 2D materials is required for future electronic devices. Here, we investigate tin disulfide (SnS2) layers depos
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fcd5831efecd9e531f5798cdb1fd9d5f
http://open-repository.kisti.re.kr/cube/handle/open_repository/475861.do
http://open-repository.kisti.re.kr/cube/handle/open_repository/475861.do