Zobrazeno 1 - 10
of 16
pro vyhledávání: '"Seokjun Jang"'
Publikováno v:
IEEE Access, Vol 9, Pp 102161-102176 (2021)
Scan-based Design for Testability (DFT) is widely used in industry as it consistently provides high fault coverage. However, scan-based DFT is prone to security vulnerabilities where attackers use the scan design to obtain secret information from the
Externí odkaz:
https://doaj.org/article/a3e31dbea9054699ac2ed36c1170d790
Publikováno v:
IEEE Access, Vol 9, Pp 120537-120550 (2021)
Scan chain diagnosis is essential to solving yield-reduction problem caused by the miniaturization of manufacturing process. The accurate diagnosis of scan chain faults that frequently occur in the initial process is vital for rapidly improving yield
Externí odkaz:
https://doaj.org/article/26ef0bac3d614d12a976edba620237b8
Publikováno v:
IEEE Access, Vol 8, Pp 163140-163151 (2020)
Nanotechnology is an important technological alternative to overcome the limitations of complementary metal-oxide-semiconductor (CMOS) technology. Various circuit implementation methods based on nanotechnology have been proposed, and their most impor
Externí odkaz:
https://doaj.org/article/84abd2cf0b8348d7913ccd5dd5c0feef
Publikováno v:
IEEE Transactions on Circuits and Systems II: Express Briefs. 70:1580-1584
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c91f80198b1092a11141496325f5954a
https://doi.org/10.1109/tcsii.2022.3216346
https://doi.org/10.1109/tcsii.2022.3216346
Publikováno v:
2022 19th International SoC Design Conference (ISOCC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::acc714b69aea9e81d68079b769d29565
https://doi.org/10.1109/isocc56007.2022.10031415
https://doi.org/10.1109/isocc56007.2022.10031415
Publikováno v:
IEEE Access, Vol 9, Pp 120537-120550 (2021)
Scan chain diagnosis is essential to solving yield-reduction problem caused by the miniaturization of manufacturing process. The accurate diagnosis of scan chain faults that frequently occur in the initial process is vital for rapidly improving yield
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::126ad5d67d0c235bab352285e80ed29c
https://ieeexplore.ieee.org/document/9524603/
https://ieeexplore.ieee.org/document/9524603/
Publikováno v:
IEEE Access, Vol 9, Pp 102161-102176 (2021)
Scan-based Design for Testability (DFT) is widely used in industry as it consistently provides high fault coverage. However, scan-based DFT is prone to security vulnerabilities where attackers use the scan design to obtain secret information from the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::98bb6a27397470cf71e9b46d9c048092
https://ieeexplore.ieee.org/document/9486853/
https://ieeexplore.ieee.org/document/9486853/
Publikováno v:
KOREAN SOCIETY AND PUBLIC ADMINISTRACTION. 31:1-21
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::94a4f1c90b614cebacfed797ca3eb9b6
https://doi.org/10.53865/kspa.2020.08.31.2.1
https://doi.org/10.53865/kspa.2020.08.31.2.1
Publikováno v:
2021 18th International SoC Design Conference (ISOCC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::70534efa00b4bcb78b5ebd0c3b479c26
https://doi.org/10.1109/isocc53507.2021.9614012
https://doi.org/10.1109/isocc53507.2021.9614012
Publikováno v:
ISOCC
Nanotechnology is considered important as an alternative technology to overcome the limitations of CMOS technology. While nanotechnology has advantages in terms of power, density and performance, it is essential to obtain defect tolerance using recon
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2a3923fed32b34d7ec5ec9f56297d3c7
https://doi.org/10.1109/isocc50952.2020.9332927
https://doi.org/10.1109/isocc50952.2020.9332927