Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Seok-Cheon Baek"'
Publikováno v:
JSTS:Journal of Semiconductor Technology and Science. 12:46-52
Separate extraction of source (RS) and drain (RD) resistances caused by process, layout variations and long term degradation is very important in modeling and characterization of MOSFETs. In this work, we propose "Avalanche Hot-Source Method (AHSM)"
Autor:
Hyojong Kim, Ja Sun Shin, Seok Cheon Baek, Jaeman Jang, Dong Myong Kim, Dae Hwan Kim, Sunyeong Lee, Hagyoul Bae, Daeyoun Yun
Publikováno v:
IEEE Electron Device Letters.
The separate extraction of asymmetric source (RS) and drain (RD) resistances caused by the variations in the layout, process, and device degradation is important in the practical modeling and characterization of MOSFETs and their integrated circuits.
Autor:
Yeong-Rak Seong, Ha-Ryoung Oh, Eun Jin Lee, Hong-Goo Cho, Myeong-Sub Jung, Yoon-Deock Lee, Kwan-Kyu Nae, Hyoung-Hwan Roh, Young-Kou Han, Seok-Cheon Baek, Jun-Seok Park, Jin-Woo Jung, Jin-Wook Jung
Publikováno v:
2007 European Radar Conference.
In this paper, an ASK (amplitude shift keying) modulator with DGS (defected ground structure) is proposed for 900-MHz RFID (radio frequency identification) system. Proposed variable DGS resonator with a varactor diode will be able to adjust the reson
Autor:
Yoon-Deock Lee, Kwan-Kyu Nae, Eun-Jin Lee, Hyoung-Hwan Roh, Jin-Wook Jung, Young-Kou Han, Jin-Woo Jung, Seok-Cheon Baek, Myeong-Sub Jung, Hong-Goo Cho, Ha-Ryoung Oh, Yeong-Rak Seong, Jun-Seok Park
Publikováno v:
2007 European Radar Conference; 2007, p381-384, 4p