Zobrazeno 1 - 10
of 30
pro vyhledávání: '"Seogwoo Lee"'
Publikováno v:
physica status solidi c. 8:2123-2126
Free-standing GaN thick films are successfully fabricated by employing intentional mechanical fracturing of Al2O3 substrates during HVPE growth followed by chemical lift-off of Al2O3 substrates after growth. To do so, thermal stress induced in the Al
Autor:
Jiho Chang, Hyunjae Lee, Gyung-Suk Kil, Jun-Seok Ha, Seogwoo Lee, Yong-gon Seo, Sungmin Whang, Seungwhan Park, Myungwhan Cho, Takafumi Yao, Jinsub Park, Mina Jung, Katsushi Fujii
Publikováno v:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 28:623-626
The authors have studied the photoluminescence (PL) intensities of a-plane (11-20) GaN films (a-GaN) as a function of x-ray rocking-curve (XRC) linewidth values measured in both c- and m-axis directions. PL intensity of well-known luminescence lines
Autor:
Seogwoo Lee, Jihyun Kim, Sung-Min Hwang, Jeong Tak, Jae Hyoun Park, Sung-Ho Lee, Kwang Hyeon Baik, Hooyoung Song, Junggeun Jhin
Publikováno v:
Journal of the Korean Physical Society. 56:1140-1143
Autor:
Soon-Ku Hong, Hyunjae Lee, Takafumi Kawauchi-jutaku Yao, Jun-Seok Ha, J.H. Chang, Chinkyo Kim, Seogwoo Lee, Meoungwhan Cho, Hyo-Jong Lee
Publikováno v:
Journal of the Korean Physical Society. 54:2404-2408
Autor:
M.W. Cho, Seogwoo Lee, Hyunjae Lee, Hyo-Jong Lee, Katsushi Fujii, Hiroki Goto, Takafumi Yao, Jun-Seok Ha, S.K. Hong
Publikováno v:
Journal of Crystal Growth. 310:920-923
Thick GaN films were grown on two different low-temperature GaN (LT-GaN)-buffer layers, i.e., one- and two-step LT-GaN buffer, by hydride vapor-phase epitaxy (HVPE). NH 4 Cl layer was included in two-step LT-GaN, which was evaluated by X-ray diffract
Autor:
W. H. Lee, Hyo-Jong Lee, Takashi Hanada, Jun-Seok Ha, Seogwoo Lee, Takafumi Yao, Hyunjae Lee, Scott-S Lee, Takenari Goto, Hiroki Goto, M.W. Cho, Tsutomu Minegishi
Publikováno v:
physica status solidi c. 4:2617-2620
Free-standing GaN layers were successfully prepared by self lift-off process. Single crystalline ZnO buffer layer and GaN layer were successively grown on sapphire substrate by plasma assisted molecular beam epitaxy. Thick GaN film was grown on this
Publikováno v:
physica status solidi c. 4:116-119
We investigate the effects of inserting defective stress absorbing layer (SAL) in between sapphire substrate and thick GaN layer. A two-step growth technique, in which GaN layers grow at different growth rates in each step, is adopted for growing hig
Autor:
S. K. Hong, Seogwoo Lee, D. C. Oh, Takafumi Yao, J. W. Choi, Meoung Whan Cho, J. E. Shin, Hiroki Goto, Jeong Soo Lee, Jun-Ho Jang, Takashi Hanada, Hyo-Jong Lee, S. R. Cho, Jun-Seok Ha, Jeong-Hyeon Choi, H. Y. Lee
Publikováno v:
physica status solidi c. 4:37-40
In order to understand the origin of leakage current, light emitting devices were grown on two different templates with apparently different dislocation density: one on thin GaN template (∼2 μm) with higher dislocation density (low × 109 cm–2)
Publikováno v:
physica status solidi c. 3:1388-1391
We propose a rocksalt (RS) structured chromium nitride (CrN) layer as a novel buffer for the growth of gallium nitride (GaN) films on c-sapphire substrate. A RS-CrN buffer has good advantages for growing GaN films on c-sapphire from the viewpoints of
Autor:
Jun-Seok Ha, Seogwoo Lee, Kayo Koike, Hyo-Jong Lee, Hyun-Yong Lee, Takafumi Yao, Meoungwhan Cho, Jinsub Park, Soon-Ku Hong, Sung Ryong Cho
Publikováno v:
IEEE Photonics Technology Letters. 24:449-451
Four types of GaN-based light-emitting diodes (LEDs) with V-pits formed in different regions were grown by metal-organic chemical vapor deposition. The position of the V-pits embedded in the layers of the LED structures was controlled by varying the