Zobrazeno 1 - 10
of 121
pro vyhledávání: '"Sensors Directorate"'
Autor:
Mike Deschenes, Sensors Directorate, Wright Patterson Afb, Wright Patterson, John F. McCalmont, James Utt, Michael Taylor
Publikováno v:
Infotech@Aerospace.
The Sensors Directorate of the Air Force Research Laboratory (AFRL), in conjunction with the Global Hawk Systems Group, the J-UCAS System Program Office and contractor Defense Research Associates, Inc. (DRA) is conducting an Advanced Technology Demon
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7070f8493a898f4a82daf147abffc256
https://doi.org/10.2514/6.2005-7176
https://doi.org/10.2514/6.2005-7176
Publikováno v:
Physical Review B: Condensed Matter and Materials Physics (1998-2015)
Physical Review B: Condensed Matter and Materials Physics (1998-2015), American Physical Society, 2017, 95, pp.121409(R). ⟨10.1103/PhysRevB.95.121409⟩
Physical Review B: Condensed Matter and Materials Physics (1998-2015), American Physical Society, 2017, 95, pp.121409(R). ⟨10.1103/PhysRevB.95.121409⟩
We propose a concept of chiral photonic limiters utilising topologically protected localised midgap defect states in a photonic waveguide. The chiral symmetry alleviates the effects of structural imperfections and guaranties a high level of resonant
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7021dd2df804032af769f3c7e2d4ac8a
https://hal.archives-ouvertes.fr/hal-01481364
https://hal.archives-ouvertes.fr/hal-01481364
Autor:
Hwang J; Weldon School of Biomedical Engineering, Purdue University, West Lafayette, IN, 47907, USA.; Optical Lens Materials Research Center, Korea Photonics Technology Institute (KOPTI), Gwangju, 61007, Republic of Korea., Zhang Y; Department of Mechanical and Aerospace Engineering, University of Virginia, Charlottesville, VA, 22904, USA., Kim B; Weldon School of Biomedical Engineering, Purdue University, West Lafayette, IN, 47907, USA.; Department of Mechanical and System Design Engineering, Hongik University, Seoul, 04066, Republic of Korea., Jeong J; Weldon School of Biomedical Engineering, Purdue University, West Lafayette, IN, 47907, USA., Yi J; School of Mechanical Engineering, Hanyang University, Seoul, 04763, Republic of Korea., Kim DR; School of Mechanical Engineering, Hanyang University, Seoul, 04763, Republic of Korea., Kim YL; Weldon School of Biomedical Engineering, Purdue University, West Lafayette, IN, 47907, USA., Urbas A; Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, OH, 45433, USA., Ariyawansa G; Sensors Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, OH, 45433, USA., Xu B; Department of Mechanical and Aerospace Engineering, University of Virginia, Charlottesville, VA, 22904, USA., Ku Z; Apex Microdevices, 4871 Misrach CT, West Chester, OH, 45069-7755, USA., Lee CH; Weldon School of Biomedical Engineering, Purdue University, West Lafayette, IN, 47907, USA.; School of Mechanical Engineering, Purdue University, West Lafayette, IN, 47907, USA.; School of Materials Engineering, Purdue University, West Lafayette, IN, 47907, USA.; Elmore Family School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, 47907, USA.; Birck Nanotechnology Center, Purdue University, West Lafayette, IN, 47907, USA.
Publikováno v:
Advanced science (Weinheim, Baden-Wurttemberg, Germany) [Adv Sci (Weinh)] 2024 Oct; Vol. 11 (40), pp. e2404870. Date of Electronic Publication: 2024 Sep 03.
Autor:
Kim G; Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, PA, 19104, USA.; Department of Engineering Chemistry, Chungbuk National University, Cheongju, 28644, Republic of Korea., Huet B; 2D Crystal Consortium-Materials Innovation Platform, Materials Research Institute, The Pennsylvania State University, University Park, PA, 16802, USA., Stevens CE; Air Force Research Laboratory, Sensors Directorate, Wright-Patterson Air Force Base, Dayton, OH, 45433, USA.; KBR Inc, Beavercreek, OH, 45431, USA., Jo K; Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, PA, 19104, USA., Tsai JY; Department of Physics, Northeastern University, Boston, MA, 02115, USA., Bachu S; Department of Materials Science and Engineering, The Pennsylvania State University, University Park, PA, 16802, USA., Leger M; Department of Materials Science and Engineering, The Pennsylvania State University, University Park, PA, 16802, USA., Song S; Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, PA, 19104, USA., Rahaman M; Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, PA, 19104, USA., Ma KY; Department of Chemistry, Ulsan National Institute of Science and Technology (UNIST), UNIST-gil 50, Ulsan, 44919, Republic of Korea., Glavin NR; Air Force Research Laboratory, Materials and Manufacturing Directorate, Wright-Patterson Air Force Base, Dayton, OH, 45433, USA., Shin HS; Department of Energy Science and Department of Chemistry, Sungkyunkwan University (SKKU), Suwon, 16419, Republic of Korea.; Center for 2D Quantum Heterostructures, Institute of Basic Science (IBS), Sungkyunkwan University (SKKU), Suwon, 16419, Republic of Korea., Alem N; 2D Crystal Consortium-Materials Innovation Platform, Materials Research Institute, The Pennsylvania State University, University Park, PA, 16802, USA.; Department of Materials Science and Engineering, The Pennsylvania State University, University Park, PA, 16802, USA., Yan Q; Department of Physics, Northeastern University, Boston, MA, 02115, USA., Hendrickson JR; Air Force Research Laboratory, Sensors Directorate, Wright-Patterson Air Force Base, Dayton, OH, 45433, USA., Redwing JM; 2D Crystal Consortium-Materials Innovation Platform, Materials Research Institute, The Pennsylvania State University, University Park, PA, 16802, USA.; Department of Materials Science and Engineering, The Pennsylvania State University, University Park, PA, 16802, USA., Jariwala D; Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, PA, 19104, USA. dmj@seas.upenn.edu.
Publikováno v:
Nature communications [Nat Commun] 2024 Jul 28; Vol. 15 (1), pp. 6361. Date of Electronic Publication: 2024 Jul 28.
Autor:
Rahaman M; Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States., Marino E; Department of Chemistry, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States.; Dipartimento di Fisica e Chimica, Università degli Studi di Palermo, Via Archirafi 36, 90123 Palermo, Italy., Joly AG; Physical and Chemical Sciences Division, Pacific Northwest National Laboratory, Richland, Washington 99352, United States., Stevens CE; Sensors Directorate, Air Force Research Laboratory, Wright-Patterson AFB, Ohio 45433, United States.; KBR Inc., Beavercreek, Ohio 45431, United States., Song S; Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States., Alfieri A; Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States., Jiang Z; Department of Chemistry, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States.; Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States., O'Callahan BT; Physical and Chemical Sciences Division, Pacific Northwest National Laboratory, Richland, Washington 99352, United States., Rosen DJ; Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States., Jo K; Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States., Kim G; Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States., Hendrickson JR; Sensors Directorate, Air Force Research Laboratory, Wright-Patterson AFB, Ohio 45433, United States., El-Khoury PZ; Physical and Chemical Sciences Division, Pacific Northwest National Laboratory, Richland, Washington 99352, United States., Murray C; Department of Chemistry, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States.; Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States., Jariwala D; Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States.
Publikováno v:
ACS nano [ACS Nano] 2024 Jun 11; Vol. 18 (23), pp. 15185-15193. Date of Electronic Publication: 2024 May 29.
Autor:
Altvater M; Air Force Research Laboratory, Materials and Manufacturing Directorate, WPAFB, OH, 45433, USA.; UES Inc., Dayton, OH, 45432, USA., Muratore C; Department of Chemical and Materials Engineering, University of Dayton, Dayton, 45469, OH, USA., Snure M; Air Force Research Laboratory, Sensors Directorate, WPAFB, OH, 45433, USA., Glavin NR; Air Force Research Laboratory, Materials and Manufacturing Directorate, WPAFB, OH, 45433, USA.
Publikováno v:
Small (Weinheim an der Bergstrasse, Germany) [Small] 2024 May 11, pp. e2400463. Date of Electronic Publication: 2024 May 11.
Autor:
Chuang HJ; Materials Science & Technology Division, Naval Research Laboratory, Washington, D.C. 20375, United States., Stevens CE; KBR Inc., Beavercreek, Ohio 45431, United States.; Sensors Directorate, Air Force Research Laboratory, Wright-Patterson AFB, Ohio 45433, United States., Rosenberger MR; University of Notre Dame, Notre Dame, Indiana 46556, United States., Lee SJ; Materials Science & Technology Division, Naval Research Laboratory, Washington, D.C. 20375, United States., McCreary KM; Materials Science & Technology Division, Naval Research Laboratory, Washington, D.C. 20375, United States., Hendrickson JR; Sensors Directorate, Air Force Research Laboratory, Wright-Patterson AFB, Ohio 45433, United States., Jonker BT; Materials Science & Technology Division, Naval Research Laboratory, Washington, D.C. 20375, United States.
Publikováno v:
Nano letters [Nano Lett] 2024 May 08; Vol. 24 (18), pp. 5529-5535. Date of Electronic Publication: 2024 Apr 26.
Autor:
Bennett RX; Department of Physics, Illinois State University, Normal, Illinois 61790, United States., Hendrickson JR; Air Force Research Laboratory, Sensors Directorate, Wright-Patterson Air Force Base, Dayton, Ohio 45433, United States., Bergfield JP; Department of Physics, Illinois State University, Normal, Illinois 61790, United States.; Department of Chemistry, Illinois State University, Normal, Illinois 61790, United States.
Publikováno v:
ACS nano [ACS Nano] 2024 May 07; Vol. 18 (18), pp. 11876-11885. Date of Electronic Publication: 2024 Apr 23.
Autor:
Jo K; Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States.; Physical Sciences Division, Pacific Northwest National Laboratory, Richland, Washington 99352, United States., Stevens CE; KBR Inc., Beavercreek, Ohio 45431, United States.; Sensors Directorate, Air Force Research Laboratory, Wright-Patterson AFB Ohio 45433, United States., Choi B; Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States., El-Khoury PZ; Physical Sciences Division, Pacific Northwest National Laboratory, Richland, Washington 99352, United States., Hendrickson JR; Sensors Directorate, Air Force Research Laboratory, Wright-Patterson AFB Ohio 45433, United States., Jariwala D; Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States.
Publikováno v:
Nano letters [Nano Lett] 2024 Apr 09. Date of Electronic Publication: 2024 Apr 09.
Autor:
Adinehloo D; Department of Electrical Engineering, University at Buffalo Buffalo NY 14228 USA vasilipe@buffalo.edu., Hendrickson JR; Sensors Directorate, Air Force Research Laboratory Wright-Patterson AFB Ohio 45433 USA., Perebeinos V; Department of Electrical Engineering, University at Buffalo Buffalo NY 14228 USA vasilipe@buffalo.edu.
Publikováno v:
Nanoscale advances [Nanoscale Adv] 2024 Apr 03; Vol. 6 (11), pp. 2823-2829. Date of Electronic Publication: 2024 Apr 03 (Print Publication: 2024).