Zobrazeno 1 - 10
of 25
pro vyhledávání: '"Senling Wang"'
Autor:
Senling Wang, Xihong Zhou, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima
Publikováno v:
ACM Transactions on Design Automation of Electronic Systems. 28:1-21
Under the functional safety standard ISO26262, automotive systems require testing in the field, such as the power-on self-test (POST) . Unlike the production test, the POST requires reducing the test application time to meet the indispensable test qu
Publikováno v:
Journal of The Japan Institute of Electronics Packaging. 24:668-674
Publikováno v:
2022 IEEE 11th Global Conference on Consumer Electronics (GCCE).
Autor:
Yoshinobu Higami, Takaya Yamauchi, Tsutomu Inamoto, Senling Wang, Hiroshi Takahashi, Kewal K. Saluja
Publikováno v:
2022 37th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC).
Autor:
Hiroyuki Iwata, Hiroshi Takahashi, Senling Wang, Yoichi Maeda, Hanan T. Al-Awadhi, Jun Matsushima, Tomoki Aono, Yoshinobu Higami
Publikováno v:
IEICE Transactions on Information and Systems. :2289-2301
Autor:
Xihong Zhou, Yoshinobu Higami, Shoichi Sekiguchi, Senling Wang, Hiroshi Takahashi, Mitsunori Katsu
Publikováno v:
2021 36th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC).
MRLD™ is a new type of reconfigurable device constructed by general SRAM array (multiple-LUTs) which has the advantages including small delay, low power and low production cost. It is therefore a promising alternative device for Artificial Intellig
Autor:
Hiroshi Takahashi, Senling Wang, Tsutomu Inamoto, Tomokazu Nakamura, Kewal K. Saluja, Yoshinobu Higami
Publikováno v:
2021 36th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC).
Use of a fault dictionary is an effective and efficient method for deducing candidate faults during fault diagnosis process. It contains output responses for every test pattern and every target fault, and therefore the size of the fault dictionary fo
Publikováno v:
IEEE Design & Test. 35:39-45
Power-on self-test is an efficient means for covering safety-critical faults in automotive systems. This paper presents a multicycle logic BIST technique that avoids fault masking after multiple cycles by sequential observation using a new scan cell
Publikováno v:
IEICE Transactions on Information and Systems. :2224-2227
Publikováno v:
2019 34th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC).
When a system is in idle/starting-up state, Field-Testing is a promising way to guarantee the reliability of an advanced system. However, the extremely limited test application time obstructs the implementation of field test. In this paper, we introd