Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Semiu A. Olowogemo"'
Publikováno v:
2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0b6ef1c984d150e1cf4dcb2d745f5e08
https://doi.org/10.1109/dft56152.2022.9962365
https://doi.org/10.1109/dft56152.2022.9962365
Publikováno v:
2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d862d756b486e632022e8b601ae2a0e5
https://doi.org/10.1109/dft56152.2022.9962348
https://doi.org/10.1109/dft56152.2022.9962348
Publikováno v:
Architecture of Computing Systems ISBN: 9783030816810
ARCS
ARCS
Protecting computation systems against soft errors is expensive. Unoptimized soft error mitigation schemes can cause area, power, and performance overheads. Therefore, efficient fault-tolerant design should be guided by assessing the cost of developi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::48000905fcb72c2ca66398a345f69a85
https://doi.org/10.1007/978-3-030-81682-7_14
https://doi.org/10.1007/978-3-030-81682-7_14
Autor:
Daniel B. Limbrick, William H. Robinson, Bor-Tyng Lin, Hao Qiu, Ahmed Yiwere, Semiu A. Olowogemo
Publikováno v:
MWSCAS
Technology scaling impacts the probability of masking a propagating transient pulse. This paper presents a technique to improve the electrical masking of logic gates when considering the variation in the process, voltage, and temperature (PVT) for a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f35df5d74ab80f6a812e3f5a88a070d8
https://doi.org/10.1109/mwscas48704.2020.9184651
https://doi.org/10.1109/mwscas48704.2020.9184651
Gem5Panalyzer: A Light-weight tool for Early-stage Architectural Reliability Evaluation & Prediction
Autor:
Xiaoxing Qiu, Hao Qiu, Semiu A. Olowogemo, Daniel B. Limbrick, Bor-Tyng Lin, William H. Robinson
Publikováno v:
MWSCAS
Aggressive technology scaling boosts the embedded processor performance but deteriorates the system resilience to soft errors. To balance trade-offs between reliability and design overheads, we developed Gem5Panalyzer: a novel light-weight reliabilit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3068a06338682f3c915cc06b518f815f
https://doi.org/10.1109/mwscas48704.2020.9184536
https://doi.org/10.1109/mwscas48704.2020.9184536
Publikováno v:
DFT
Single Event Transients (SETs) induced from radiation strikes on an integrated circuit (IC) can be masked electrically by logic gates while propagating through the circuit towards a storage element (e.g., flip-flop). With the continuous scaling of CM
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9691bdc59b7171084a4b6053caf5bee9
https://doi.org/10.1109/dft.2018.8602975
https://doi.org/10.1109/dft.2018.8602975