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pro vyhledávání: '"Semaan I. Salem"'
Autor:
Semaan I. Salem, Harold P. Hanson
Publikováno v:
Physical Review. 124:16-21
By measuring x-ray emission profiles as a function of voltage, the depth of penetration of the cathode electrons involved may be calculated. Similarly, the effective depth of x-ray production may be obtained. Uncertainties exist because of conditions
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::186f31f3fcc70edbb8498654c6aff187
https://doi.org/10.1103/physrev.124.16
https://doi.org/10.1103/physrev.124.16
