Loss of insulation vacuum tests on an EuXFEL cryomodule.

Autor: Barbanotti, S, Boeckmann, T, Bozhko, Y, Jensch, K, Klos, R, Ramalingam, R, Dhillon, A K, Schnautz, T, Sellmann, D

Publikováno v: IOP Conference Series: Materials Science & Engineering; 2024, Vol. 1301 Issue 1, p1-8, 8p

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Phosphane effects on formation and reactivity of [Ru(L)(PR3)(`N2Me2S2')] complexes with L=N2, N2H4, NH3, and CO

Autor: Sellmann, D., Hille, A., Rösler, A., Heinemann, F.W., Moll, M.

Publikováno v: In Inorganica Chimica Acta 5 August 2004 357(11):3336-3350

Cryogenics of European XFEL Accelerator Module Test Facility

Autor: Bozhko, Y., Petersen, B., Schnautz, T., Sellmann, D., L Wang, X., Zhirnov, A., Zolotov, A.

Publikováno v: International cryogenic engineering conference 23, Wroclaw, Poland, 2010-07-19-2010-07-23

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od______1108::8fc99cef5bc8efa2a7cc08f99987901d
https://bib-pubdb1.desy.de/record/89271

XFEL: The European X-Ray Free-Electron Laser - Technical Design Report

Autor: Abela, R., Aghababyan, A., Altarelli, M., Altucci, C., Amatuni, G., Anfinrud, P., Audebert, P., Ayvazyan, V., Baboi, N., Baehr, J., Balandin, V., Bandelmann, R., Becker, J., Beutner, B., Blome, C., Bohnet, I., Bolzmann, A., Bostedt, C., Bozhko, Y., Brandt, A., Bratos, S., Bressler, C., Brovko, O., Brück, H., Carneiro, J.-P., Casalbuoni, S., Castellano, M., Castro, P., Catani, L., Cavalleri, A., Celik, S., Chapman, H., Charalambidis, D., Chen, J., Chergui, M., Choroba, S., Cianchi, A., Clausen, M., Collet, E., Danared, H., David, C., Decking, W., Dehler, M., Delsim-Hashemi, H., Dipirro, G., Dobson, B., Dohlus, M., Duesterer, S., Eckhardt, A., Eckoldt, H.-J., Edwards, H., Faatz, B., Fajardo, M., Fateev, A., Feldhaus, J., Filipov, Y., Floettmann, K., Follath, R., Fominykh, B., French, M., Frisch, J., Froehlich, L., Gadwinkel, E., García-Tabarés, L., Gareta, J. J., Garvey, T., Gel'mukhanov, F., Gensch, U., Gerth, C., Goerler, M., Golubeva, N., Graafsma, H., Graeff, W., Grimm, O., Griogoryan, B., Grübel, G., Gutt, C., Hacker, K., Haenisch, L., Hahn, U., Hajdu, J., Han, J. H., Hartrott, M., Havlicek, J., Hensler, O., Honkavaara, K., Honkimäki, V., Hott, T., Howells, M. R., Huening, M., Ihee, H., Ilday, F. Ö., Ischebeck, R., Jablonka, M., Jaeschke, E., Jensch, K., Jensen, J.-P., Johnson, S., Juha, L., Kaerntner, F., Kammering, R., Kapitza, H., Katalev, V., Keil, B., Khodyachykh, S., Kienberger, R., Kim, J.-W., Kim, Y., Klose, K., Kocharyan, V., Koehler, W., Koerfer, M., Kollewe, M., Kong, Q., Kook, W., Kostin, D., Kozlov, O., Kraemer, D., Krasilnikov, M., Krause, B., Krebs, O., Krzywinski, J., Kube, G., Kuhlmann, M., Laich, H., Lange, R., Larsson, M., Lee, R. W., Leuschner, A., Lierl, H., Lilje, L., Limberg, T., Lindenberg, A., Lipka, D., Loehl, F., Ludwig, K., Luong, M., Magne, C., Maquet, A., Marangos, J., Masciovecchio, C., Maslov, M., Matheisen, A., Matyushevskiy, E., Matzen, O., May, H.-J., McNulty, I., McCormick, D., Meulen, P., Meyners, N., Michelato, P., Mildner, N., Miltchev, V., Minty, M., Moeller, W.-D., Möller, T., Monaco, L., Nagl, M., Napoly, O., Neubauer, G., Nicolosi, P., Nienhaus, A., Noelle, D., Nunez, T., Obier, F., Oppelt, A., Pagani, C., Paparella, R., Pedersen, H. B., Petersen, B., Petrosyan, B., Petrosyan, L., Petrov, A., Pflueger, J., Piot, P., Plech, A., Ploenjes, E., Poletto, L., Pöplau, G., Prat, E., Prat, S., Prenting, J., Proch, D., Pugachov, D., Quack, H., Racky, B., Ramert, D., Redlin, H., Rehlich, K., Reininger, R., Remde, H., Reschke, D., Richter, D., Richter, M., Riemann, S., Riley, D., Robinson, I., Roensch, J., Rosmej, F., Ross, M., Rossbach, J., Rybnikov, V., Sachwitz, M., Saldin, E., Sandner, W., Schäfer, J., Schilcher, T., Schlarb, H., Schloesser, M., Schlott, V., Schmidt, B., Schmitz, M., Schmueser, P., Schneider, J., Schneidmiller, E., Schotte, F., Schrader, S., Schreiber, S., Schroer, C., Schuch, R., Schulte-Schrepping, H., Schwarz, A., Seidel, M., Sekutowicz, J., Seller, P., Sellmann, D., Senf, F., Sertore, D., Shabunov, A., Simrock, S., Singer, W., Sinn, H., Smith, R., Sombrowski, E., Sorokin, A. A., Springate, E., Staack, M., Staykov, L., Steffen, B., Stephenson, B., Stephan, F., Stulle, F., Syresin, E., Sytchev, K., Sytchev, V., Tallents, G., Techert, S., Tesch, N., Thom, H., Tiedtke, K., Tischer, M., Tolan, M., Toleikis, S., Toral, F., Treusch, R., Trines, D., Tsakanov, V., Tsakov, I., Tschentscher, T., Ullrich, F.-R., van Rienen, U., Variola, A., Vartaniants, I., Vogel, E., Vogel, J., Vuilleumier, R., Wabnitz, H., Wanzenberg, R., Wark, J. S., Weddig, H., Weiland, T., Weise, H., Wendt, M., Wenndorff, R., Wichmann, R., Will, I., Winter, A., Witte, K., Wittenburg, K., Wochner, P., Wohlenberg, T., Wojtkiewicz, J., Wolf, A., Wulff, M., Yurkov, M., Zagorodnov, I., Zambolin, P., Zapfe, K., Zeitoun, P., Ziemann, V., Zolotov, A., Brinkmann, R., Grabosch, H.-J.

Publikováno v: Hamburg : DESY 1-646 (2006). doi:10.3204/DESY_06-097

This report contains a comprehensive technical description of a new international research infrastructure, the European X-Ray Free-Electron Laser (XFEL) Facility. It was written between October 2005 and June 2006 and provides a realistic cost estimat

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::af1d332e9359601123bda1c4458dcddf