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pro vyhledávání: '"Segabinazzi Ferreira, Raphael"'
Since electronics started to scale down, a growing concern about the reliability of these electronic devices has emerged. At the same time, the increased demand for high performance within the safety- and mixed-critical domains, such as the aerospace
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f0fbf65f68eb1401abb99bccc34bd353
Autor:
Segabinazzi Ferreira, Raphael, George, Nevin, Chen, Junchao, Hübner, Michael, Krstic, Milos, Nolte, Jörg, Vierhaus, Heinrich
Scaling minimum features of ICs down to the 10nm- area and below has allowed high integration rates in electronics. Scaling at supply voltages of 1V and below also implies a rising level of stress which drives aging effects that reduce switching spee
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::22cb397862e71561fb36de4a9e455080
https://doi.org/10.26127/btuopen-5050
https://doi.org/10.26127/btuopen-5050