Zobrazeno 1 - 10
of 11
pro vyhledávání: '"Sebin Augustine"'
Autor:
Basanta Kumar Parida, K.P. Sooraj, Sukriti Hans, Vivek Pachchigar, Sebin Augustine, T. Remyamol, M.R. Ajith, Mukesh Ranjan
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 514:1-7
Autor:
Vivek Pachchigar, Basanta Kumar Parida, Sebin Augustine, Sukriti Hans, Mahesh Saini, K.P. Sooraj, Mukesh Ranjan
Publikováno v:
Thin Solid Films. 777:139888
Autor:
Sebin Augustine, Mahesh Saini, Sooraj K.P., Basanta Kumar Parida, Sukriti Hans, Vivek Pachchigar, Biswarup Satpati, Mukesh Ranjan
Publikováno v:
Optical Materials. 135:113319
Autor:
null Sudheer, Vivek Pachchigar, Biswarup Satpati, Sooraj KP, Sebin Augustine, Sukriti Hans, Mukesh Ranjan
Publikováno v:
Applied Surface Science. 607:154999
Autor:
Sukriti Hans, Basanta Kumar Parida, Vivek Pachchigar, Sebin Augustine, Sooraj KP, Mukesh Ranjan
Publikováno v:
Nanotechnology. 33(40)
Ion beam sputtering, known as potential technique for producing nanoripple on various surfaces having wide range of applications. Along with nanoripple, triangular features are also superimposed, limiting their use for some potential applications. He
Publikováno v:
Modern Techniques of Spectroscopy ISBN: 9789813360839
Ellipsometry is a versatile optical measurement technique which uses polarized light as a probe to characterize various properties of materials viz. film thickness, dielectric functions, uniformity, etc. by detecting the change in the polarization st
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e4fd281224b8949a4bad470b63fefdf3
https://doi.org/10.1007/978-981-33-6084-6_20
https://doi.org/10.1007/978-981-33-6084-6_20
Autor:
Vivek Pachchigar, Basanta Kumar Parida, Mahesh Saini, Sukriti Hans, K.P. Sooraj, Sebin Augustine, Mukesh Ranjan
Publikováno v:
Surfaces and Interfaces. 28:101619
Low energy ion beam-induced nanoscale ripple patterns have attracted attention due to their use in various technological applications. Making defect free, highly regular, and low wavelength (∼30 nm) ripple patterns is still under investigation as r
Autor:
Devilal Kumawat, Vivek Pachchigar, K.P. Sooraj, Mukesh Ranjan, Subroto Mukherjee, Sebin Augustine, K. Tahiliani
Publikováno v:
Surface and Coatings Technology. 420:127331
The bouncing dynamics of impacting water droplet on low energy ion beam produced superhydrophobic PTFE surfaces was investigated for the self-cleaning application. Ion beam with 300 eV and 800 eV energies was used to produce nanostructures on PTFE su
Publikováno v:
Applied Surface Science. 544:148878
Ion beam irradiation produced ripple nanopatterns on Si surface was used to produce a highly dense and sensitive SERS substrate for detecting Dichlorvos pesticide below the permissible limit. The wavelength of the ripple varied from 22 nm to 35 nm by
Publikováno v:
Applied Surface Science. 512:145703
In this work, we report on substrate morphology-mediated plasmonic anisotropy and surface-enhanced Raman scattering-based molecular detection efficacy of oblique angle grown self-organized gold nanoparticles (Au-NPs) on ultralow energy ion-beam fabri