Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Sebastien Marchal"'
Autor:
F. Pourchon, Rohit Goel, Kedar Janardan Dhori, Sylvain Clerc, Robin Wilson, Sebastien Marchal, Ricardo Gomez Gomez, Christian Dutto
Publikováno v:
ESSCIRC
This paper presents circuit monitoring, reviewing different classes of silicon monitoring solutions, the specificity of each class, and where they best fit in the life-cycle of circuit design. A diversified circuit monitoring strategy is presented, t
Publikováno v:
Integrated Circuits and Systems ISBN: 9783030394950
This chapter deals with digital static timing analysis and implementation methodology, covering design corners definition, implementation corners selection, power grid with specific aspect added or changed with body-bias.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2ae528acce8ec94aba11c827dd1200b8
https://doi.org/10.1007/978-3-030-39496-7_16
https://doi.org/10.1007/978-3-030-39496-7_16
Publikováno v:
2009 International Conference on Microelectronics - ICM.
Global and Environmental variations together are responsible for differences in timing from one die to another for an ASIC design. The tried and tested method of corners and margins is still the dominant method in ASIC industry to assure the timing c
Publikováno v:
2009 NORCHIP.
Random intra-die variation is an ever-increasing concern in the microelectronics industry. Analysis solutions available today are complex to implement industrially. Most works on intra-die variations concentrate on systematic mismatch that is amelior