Zobrazeno 1 - 10
of 30
pro vyhledávání: '"Sebastiano Russo"'
Publikováno v:
Applied Sciences, Vol 13, Iss 11, p 6389 (2023)
We deal with the flutter analysis of the George Washington bridge, in both the single- and double-deck configurations of 1931 and 1962, respectively. The influence of the additional lower deck on the aerodynamic behavior is investigated. To overcome
Externí odkaz:
https://doaj.org/article/4ccbac775a44445db3233ab9baec9f9c
Publikováno v:
Mediterranean Journal of Clinical Psychology, Vol 3, Iss 1 (2015)
Mental Imagery (i.e., processing of objects’ properties and spatial relations, including the ability of mentally rotating and manipulating objects in the space), is relevant for movement and its development, and particularly for rehabilitation of m
Externí odkaz:
https://doaj.org/article/1f993d8022cd4d10aacb3319f1b94518
Publikováno v:
2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::652e15be02b87e90710da9d0649da1b6
https://doi.org/10.1109/iolts56730.2022.9897452
https://doi.org/10.1109/iolts56730.2022.9897452
Publikováno v:
IEEE Transactions on Device and Materials Reliability. 19:159-163
The purpose of this paper is to predict the device lifetime under a power cycling test by a simulation method that is based on a distributed self-heating SPICE model. Correlation between numeric extrapolation and experimental data is done by consider
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ea514dbfdec4509ab95174b7f5232279
https://doi.org/10.1109/tdmr.2019.2892185
https://doi.org/10.1109/tdmr.2019.2892185
Autor:
Francesca Garescì, Angelo Alberto Messina, Claudia Triolo, Michele Calabretta, S. Panarello, Laura Anoldo, Salvatore Patanè, Sebastiano Russo
Publikováno v:
IEEE Electron Device Letters
Power SiC MOSFETs are going to substitute Si devices by to their significantly better performances that make them much suitable in power switching applications such as electric/hybrid vehicles. The increasingly use of these devices in critical missio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bae264dc244d39e0e7946179c7a0e275
Autor:
Alessandro Sitta, Angelo Alberto Messina, Marco Torrisi, Sebastiano Russo, Marco Renna, Giuseppe D'Arrigo, Michele Calabretta, Gaetano Sequenzia
Publikováno v:
2020 21st International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)
This work has investigated the impact of crystallographic structure on SnAgCu (SAC) solder reliability at print board circuit (PCB) level. A detailed reliability analysis has been performed on packages with different solder thickness. The correlation
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a8d4ca7ca486e27cc408a06763f7b2d7
Autor:
Alessandro Sitta, Marco Santopa, Michele Calabretta, Marco Torrisi, Sebastiano Russo, Marco Renna
Publikováno v:
PRIME
High temperature application and long term reliability are the future trends for power electronics. A key factor to enable future applications is the interconnection durability improvement under high temperature and thermo-mechanical cycling loads. N
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2fa6edf7d43f2be17cb85bc6ac7a862b
https://doi.org/10.1109/prime.2019.8787819
https://doi.org/10.1109/prime.2019.8787819
Autor:
Antonio Testa, Mario Pulvirenti, Sebastiano Russo, Giacomo Scelba, S. Foti, Salvatore De Caro, Tommaso Scimone
Voltage wave reflection phenomena along power cables are particularly threatening on ac motor drives equipped with silicon carbide power mosfet s due to very short switching times and high switching frequency. Overvoltage suppression resistance induc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f5d53b56b44ec8015e1b2f99159e3e53
http://hdl.handle.net/11570/3148059
http://hdl.handle.net/11570/3148059
Autor:
S. De Caro, Giacomo Scelba, S. Panarello, Antonio Testa, G. Scarcella, Salvatore Patanè, Tommaso Scimone, Sebastiano Russo
Publikováno v:
IEEE Transactions on Industry Applications. 52:1688-1697
A strong demand for even more compact and reliable power electronic devices has powered the development of advanced design techniques. A key role is played in these techniques by the reliability assessment, a procedure that estimates the expected lif
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e7d1487e1d9ac23e7714c0734d51579e
https://doi.org/10.1109/tia.2015.2500890
https://doi.org/10.1109/tia.2015.2500890
Autor:
Daniela Cavallaro, Alessandro Sitta, Gaetano Bazzano, Giuseppe Greco, Sebastiano Russo, Michele Calabretta
Publikováno v:
DTIS
The scope of this paper is to work out a predictive method to estimate the power device reliability under active cycle tests. The proposed method is able to predict, through a numerical model, the local maximum temperature during test. The results va
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bfd3f3e61f362365e3c20d169318695e
https://doi.org/10.1109/dtis.2018.8368577
https://doi.org/10.1109/dtis.2018.8368577