Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Sebastian F. Carron Montero"'
Autor:
Johan Hattne, Jeffrey J. Donatelli, Peter Schwander, Lutz Foucar, Andreas Menzel, Billy K. Poon, Erik Malmerberg, Elisabeth Hartmann, Lars Englert, Katerina Dörner, Raymond G. Sierra, R. Bruce Doak, Shibom Basu, John D. Bozek, Petrus H. Zwart, Robert Hartmann, Abbas Ourmazd, Cheryl A. Kerfeld, Sabine Botha, M. Marvin Seibert, Nicholas K. Sauter, Lukas Lomb, Christoph Bostedt, Sascha W. Epp, Artem Rudenko, Raimund Fromme, Guenter Hauser, Markus Sutter, Stephan Kassemeyer, Kanupriya Pande, Ilme Schlichting, Michael J. Bogan, Sebastian F. Carron Montero, Ahmad Hosseinizadeh, Daniel Rolles, Petra Fromme
Publikováno v:
Scientific Data
Pande, K; Donatelli, JJ; Malmerberg, E; Foucar, L; Poon, BK; Sutter, M; et al.(2018). Free-electron laser data for multiple-particle fluctuation scattering analysis. Scientific Data, 5, 180201. doi: 10.1038/sdata.2018.201. Lawrence Berkeley National Laboratory: Retrieved from: http://www.escholarship.org/uc/item/5sd309r0
Scientific data, vol 5, iss 1
Pande, K; Donatelli, JJ; Malmerberg, E; Foucar, L; Poon, BK; Sutter, M; et al.(2018). Free-electron laser data for multiple-particle fluctuation scattering analysis. Scientific Data, 5, 180201. doi: 10.1038/sdata.2018.201. Lawrence Berkeley National Laboratory: Retrieved from: http://www.escholarship.org/uc/item/5sd309r0
Scientific data, vol 5, iss 1
Fluctuation X-ray scattering (FXS) is an emerging experimental technique in which solution scattering data are collected using X-ray exposures below rotational diffusion times, resulting in angularly anisotropic X-ray snapshots that provide several o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d5a034bc8bbe8245b062d29324d95c33
https://doi.org/10.1038/sdata.2018.201
https://doi.org/10.1038/sdata.2018.201
Autor:
Razib Obaid, Daniel Rolles, John D. Bozek, Christoph Bostedt, J. C. Castagna, Timur Osipov, Artem Rudenko, Michele Swiggers, Ken R. Ferguson, Nora Berrah, Maximilian Bucher, Sebastian F. Carron Montero
Publikováno v:
Review of scientific instruments 89(3), 035112 (2018). doi:10.1063/1.5017727
Review of scientific instruments 89(3), 035112 (2018). doi:10.1063/1.5017727
The Laser Applications in Materials Processing (LAMP) instrument is a new end-station for soft X-ray imaging, high-field physics, and ultrafast X-ray science experiment
The Laser Applications in Materials Processing (LAMP) instrument is a new end-station for soft X-ray imaging, high-field physics, and ultrafast X-ray science experiment
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e1f66b83b5d3d93538a73b66bb00b4e8
https://bib-pubdb1.desy.de/record/417941
https://bib-pubdb1.desy.de/record/417941
Autor:
J. C. Castagna, John D. Bozek, Timur Osipov, Hui Xiong, Sebastian F. Carron Montero, Nora Berrah, Ken R. Ferguson, Vlad S. Petrovic, Edwin Kukk, Ryan Coffee, Li Fang, Brendan Murphy
Publikováno v:
Optics Express. 24:11768
We built a two-mirror based X-ray split and delay (XRSD) device for soft X-rays at the Linac Coherent Light Source free electron laser facility. The instrument is based on an edge-polished mirror design covering an energy range of 250 eV-1800 eV and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ee6ff9ecb4452bd3cd19e2ac9605ea4e
https://doi.org/10.1364/oe.24.011768
https://doi.org/10.1364/oe.24.011768