Zobrazeno 1 - 10
of 12
pro vyhledávání: '"Sean P. Ogden"'
Autor:
Kripa Shankar, Nathan P. Metzger, Omprakash Singh, Bharath K. Mani, Sherri Osborne-Lawrence, Salil Varshney, Deepali Gupta, Sean B. Ogden, Shota Takemi, Corine P. Richard, Karabi Nandy, Chen Liu, Jeffrey M. Zigman
Publikováno v:
Molecular Metabolism, Vol 53, Iss , Pp 101327- (2021)
Objective: The hormone liver-expressed antimicrobial peptide-2 (LEAP2) is a recently identified antagonist and an inverse agonist of the growth hormone secretagogue receptor (GHSR). GHSR's other well-known endogenous ligand, acyl-ghrelin, increases f
Externí odkaz:
https://doaj.org/article/e32018ffecae4cc2938c33deb5f50823
Publikováno v:
Molecular Metabolism, Vol 46, Iss , Pp 101128- (2021)
Background: The hormone ghrelin stimulates food intake, promotes adiposity, increases body weight, and elevates blood glucose. Consequently, alterations in plasma ghrelin levels and the functioning of other components of the broader ghrelin system ha
Externí odkaz:
https://doaj.org/article/82a1e97734cb4d428997150adb56f0da
Publikováno v:
Microelectronics Reliability. 91:232-242
As the minimum pitch in interconnects continues to shrink, dielectric breakdown is becoming increasingly more difficult to qualify for each new technology node. Standard voltage-acceleration models provide quick, but general, assessments of the diele
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::72b3720528202e1e8255d97872bc3096
https://doi.org/10.1016/j.microrel.2018.10.005
https://doi.org/10.1016/j.microrel.2018.10.005
Publikováno v:
IEEE Electron Device Letters. 38:119-122
Low- $\kappa $ SiCOH reliability is a growing concern for integrated circuit reliability. An important consideration for product qualification involves the accurate extrapolation to the low percentile failures based on the results from a group of sam
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f57cfdbefc856c8260afa8dad644e617
https://doi.org/10.1109/led.2016.2631718
https://doi.org/10.1109/led.2016.2631718
Publikováno v:
IRPS
As operating frequency of the chips keeps increasing, high capacitance density MIMCap is needed to mitigate voltage droop for faster current injection. With high capacitance density, it is challenging to retain low leakage and long reliability lifeti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8b7113b800d5f55d7af258892f8cd117
https://doi.org/10.1109/irps.2019.8720407
https://doi.org/10.1109/irps.2019.8720407
Autor:
Haojun Zhang, Tian Shen, Ronald G. Filippi, Linjun Cao, Bianzhu Fu, Kong Boon Yeap, Seungman Choi, Cathryn Christiansen, Patrick Justison, James Zhang, Sean P. Ogden
Publikováno v:
IRPS
Electromigration reliability of BEOL Cu interconnects with various metal line widths and via sizes has been studied. EM lifetime significantly improves from minimum width to three times the minimum width, and then saturates. In addition, the EM lifet
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f339b2b92ceef48dc5396572ea2db08f
https://doi.org/10.1109/irps.2018.8353600
https://doi.org/10.1109/irps.2018.8353600
Publikováno v:
IRPS
Non-Poisson area scaling behavior has long been observed in BEOL (Back End Of Line) and MOL (Middle Of Line) Time-dependent dielectric breakdown (TDDB) reliability tests due to known variations across the wafer. Three different statistical models hav
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::235aa87a115b0b86631fa0ff54cb40ab
https://doi.org/10.1109/irps.2018.8353661
https://doi.org/10.1109/irps.2018.8353661
Autor:
Patrick L. Heider, James M. B. Evans, Christopher J. Testa, Brahim Benyahia, Aaron Wolfe, Richard D. Braatz, Sean P. Ogden, Haitao Zhang, Devin R. Hersey, Paul I. Barton, Salvatore Mascia, Richard Lakerveld
Publikováno v:
Organic Process Research & Development. 19:1088-1100
Continuous manufacturing offers potential opportunities for the improved manufacturing of pharmaceutical products. A key challenge is the development of an appropriate control strategy. The experimental application of an automated control strategy is
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::01de218c0b58a73bd6c6bf7a14e496e7
https://doi.org/10.1021/op500104d
https://doi.org/10.1021/op500104d
Publikováno v:
IRPS
A Multiple I-V Ramp Test is designed to stress low-k SiCOH-based dielectrics that have absorbed moisture. Two conduction regimes are found based on the total injected fluence into the dielectric films and the concentration of water in the dielectric.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d523c34e98859f1d2411ebd909951bde
https://doi.org/10.1109/irps.2015.7112776
https://doi.org/10.1109/irps.2015.7112776
Autor:
Patrick L. Heider, Sean P. Ogden, Brahim Benyahia, James M. B. Evans, Christopher J. Testa, Salvatore Mascia, Aaron Wolfe, Paul I. Barton, Richard Lakerveld, Richard D. Braatz, Devin R. Hersey, Haitao Zhang
Publikováno v:
ACC
Continuous manufacturing has the potential to provide substantial improvements to the manufacturing of pharmaceutical products compared to traditional batch-wise manufacturing. A key challenge is the development of effective control strategies for th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dcf096ccb6beda9287aa80931ac2e3c3
https://doi.org/10.1109/acc.2014.6858854
https://doi.org/10.1109/acc.2014.6858854