Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Se-Yeon Jang"'
Publikováno v:
Poultry Science, Vol 103, Iss 10, Pp 104029- (2024)
Micelle silymarin (MS) is recognized for its diverse range of beneficial properties, which encompass anti-inflammatory, antioxidant, hepatoprotective, and antidiabetic effects. The main objective of this study was to examine the effects of micelle si
Externí odkaz:
https://doaj.org/article/0133445eccb445f79c37be1e5c72e812
Autor:
Maarten Boogaarts, Young-Jun Kim, Khalid Elbattay, Balaji Rangarajan, Marcel Bontekoe, Andrew Moe, Young Seog Kang, Tony Park, Chung-Yong Kim, Dong Kyung Han, Axel von Sydow, Jeong Heung Kong, Jan-Pieter van Delft, Arjan Donkerbroek, Se Yeon Jang, Jeroen Cottaar, Ruiyue Ouyang, Jin Phil Choi, Jeroen H. G. C. Rutten
Publikováno v:
SPIE Proceedings.
The next generation technology and emerging memory devices require gradually tighter lithographic focus control on imaging critical layers. Especially in case of BEOL process, big PDO (Process Dependent Offset) from large intra-field topography steps
Autor:
Machi Ryu, Chung-Yong Kim, Austin Peng, Jeong Heung Kong, Yun-A Sung, Se Yeon Jang, Ju Hee Shin, Khalid Elbattay, Noh-Kyoung Park, Zhao-Ze Li, Jin Phil Choi, Young Seog Kang, Tony Park, Peter Nikolsky, Chris Strolenberg, Jangho Shin, Andrew Moe, Anand Guntuka, Vito Tomasello, Ronald Goossens, Du Hyun Beak, Dong Kyeng Han
Publikováno v:
SPIE Proceedings.
Shrinking pattern sizes dictate that scanner-to-scanner variations for HVM products shrink proportionally. This paper shows the ability to identify (a subset of) root causes for mismatch between ArF immersion scanners using scanner metrology. The roo
Autor:
Stefan Weichselbaum, Joris Jongen, Se-Yeon Jang, Jang Jonghoon, Young Ha Kim, Jeong-Heung Kong, Niek Verbeek, Richard Droste, Bart Dinand Paarhuis, Roelof de Graaf, Young Seog Kang, YoungSun Nam, Jeroen van der Wielen, Byeong Soo Lee, Hyunwoo Hwang, Marco Koert Stavenga, Barry Moest
Publikováno v:
SPIE Proceedings.
Scanners in High-Volume-Manufacturing conditions will experience a large range of reticles that vary in reticle transmission and reticle diffraction characteristics. Especially under full production loads reticles will heat up due to the exposure lig
Publikováno v:
Journal of Animal Science; 2023 Supplement, Vol. 101, p323-323, 1p
Publikováno v:
Journal of Animal Science; 2023 Supplement, Vol. 101, p301-301, 1p
Publikováno v:
Journal of Animal Science; 2023 Supplement, Vol. 101, p300-300, 1p
Publikováno v:
Journal of Animal Science; 2023 Supplement, Vol. 101, p278-278, 1p
Intra-lot wafer by wafer overlay control using integrated and standalone metrology combined sampling
Autor:
YoungSun Nam, Dong Han Lee, Jae-Il Lee, Young Seog Kang, Se Yeon Jang, Young Sin Choi, Jeong Heung Kong
Publikováno v:
SPIE Proceedings.
As overlay margin is getting tighter, traditional overlay correction method is not enough to secure more overlay margin without extended correction potential on lithography tool. Timely, the lithography tool has a capability of wafer to wafer correct