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Publikováno v:
2016 IEEE Radiation Effects Data Workshop (REDW).
The SEL and TID test results are presented for the Cobham radiation hardened bus switch family of products. The device is SEL immune to an effective LET ≤ 100 MeV·cm2/mg and TID qualified to 300krad(Si).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f16e78db54e4c9dc87fa0fd5b6cf72e7
https://doi.org/10.1109/nsrec.2016.7891735
https://doi.org/10.1109/nsrec.2016.7891735
