Zobrazeno 1 - 10
of 38
pro vyhledávání: '"Scott R. Bryan"'
Publikováno v:
Microscopy and Microanalysis, 23(4), 843-848. Cambridge University Press
We present the first demonstration of a general method for the chemical characterization of small surface features at high magnification via simultaneous collection of mass spectrometry (MS) imaging and tandem MS imaging data. High lateral resolution
Publikováno v:
Hyomen Kagaku. 37:354-358
Publikováno v:
Microscopy and Microanalysis. 26:2996-2996
Autor:
Noriaki Sanada, Scott R. Bryan, Takuya Miyayama, Gregory L. Fisher, John S. Hammond, Shin-ichi Iida
Publikováno v:
Surface and Interface Analysis. 46:83-86
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has become widely used to characterize various kinds of materials, especially organic materials. It has recently become possible to investigate the molecular distributions underneath the surfa
Autor:
Gregory L. Fisher, Anne L. Bruinen, Scott R. Bryan, John S. Hammond, Nina Ogrinc Potočnik, Ron M. A. Heeren
Publikováno v:
Proceedings of Microscopy & Microanalysis 2016. 22(S3)
Publikováno v:
Surface and Interface Analysis. 42:1453-1457
An Ar Gas Cluster Ion Beam (GCIB) has been shown to remove previous Ar+ ion beam-induced surface damage to a bulk polyimide (PI) film. After removal of the damaged layer with a GCIB sputter source, XPS measurements show minor changes to the carbon, n
Autor:
Scott R. Bryan, Gregory L. Fisher, Noriaki Sanada, Takuya Miyayama, Mineharu Suzuki, Shin-ichi Iida
Publikováno v:
e-Journal of Surface Science and Nanotechnology. 7:878-881
Cluster ions such as C60+ are well used as the sputtering ions for polymer depth profiling. The molecules of analyte surfaces are occasionally damaged by the ion bombardment during sputtering, leading to a loss of the molecular information. In order
Publikováno v:
Applied Surface Science. 255:819-823
Sputtering of organic materials using a C 60 primary ion beam has been demonstrated to produce significantly less accumulated damage compared to sputtering with monatomic and atomic-cluster ion beams. However, much about the dynamics of C 60 sputteri
Autor:
Tatsuro Hanajiri, Noriaki Sanada, Shin-ichi Iida, Nobuaki Urushihara, Scott R. Bryan, Hiroshi Iwai, Yoshikata Nakajima, Parhat Ahmet, Kuniyuki Kakushima, Mineharu Suzuki, D. F. Paul, Kazuo Tsutsui
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 26:668-672
Three dimensional Auger elemental distributions have been constructed from the combination of high spatial resolution, two dimensional Auger maps obtained at multiple sputter depths. These three dimensional elemental distributions have been used to c
Publikováno v:
Microscopy and Microanalysis. 22:348-349