Zobrazeno 1 - 10
of 23
pro vyhledávání: '"Scott Popelar"'
Autor:
Sean Brinlee, Scott Popelar, Ph.D.
Publikováno v:
IMAPSource Proceedings. 2022
Solder fatigue failure is one of the primary wear out failure mechanisms limiting reliability in microelectronics flip chip packaging. Solder fatigue failure occurs when a crack initiates and subsequently propagates through the entirety of the solder
Publikováno v:
International Symposium on Microelectronics. 2021:000195-000200
The experimental study described herein investigates thermomigration of both eutectic Sn/Pb and lead free Sn/Ag/Cu solder joints, with the additional focus on the development of an Arrhenius failure model of time-to- failure as a function of temperat
Publikováno v:
Microelectronics Reliability. 42:265-283
Electroless nickel and immersion gold plating technologies (e-Ni/Au) have traditionally been used almost exclusively within the electronics industry to create a solderable surface on substrate materials, e.g. laminate boards. Recent advances in these
Autor:
Brinlee, Sean1 sean.brinlee@frontgrade.com, Popelar, Scott1
Publikováno v:
Journal of Microelectronic & Electronic Packaging. 2023, Vol. 20 Issue 1, p27-35. 9p.
Publikováno v:
Journal of Microelectronic & Electronic Packaging. 2022, Vol. 19 Issue 2, p77-82. 6p.
Autor:
Erickson, Curt1 cerickson@icinterconnect.com, Popelar, Scott1 spopelar@icinterconnect.com
Publikováno v:
Advanced Packaging. Nov2005, Vol. 14 Issue 11, p26-27. 2p. 1 Chart, 3 Graphs.
Publikováno v:
Electronic Design. May2015 Supplement, pS10-S10. 1/4p.
Publikováno v:
Microwaves & RF. Apr2015, Vol. 54 Issue 4, pS10-S10. 1/4p. 1 Color Photograph.
Publikováno v:
2016 International Conference on Electronics Packaging (ICEP); 2016, p512-517, 6p
Publikováno v:
Advancing Microelectronics; Jul/Aug2021, Vol. 48 Issue 4, p11-17, 5p