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pro vyhledávání: '"Scott Overall"'
Autor:
Scott Overall
Publikováno v:
Architectonics and Parametric Thinking ISBN: 9781003252634
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8a231f95618fcfeb96358204cb2d81e9
https://doi.org/10.4324/9781003252634-9
https://doi.org/10.4324/9781003252634-9
Autor:
Scott Overall, John Paul Rysavy
Publikováno v:
Technology|Architecture + Design. 4:246-248
A reference to custom repetitive manufacturing for architects, Dana K. Gulling's Manufacturing Architecture: An Architect's Guide to Custom Processes, Materials, and Applications forefronts the pro...
Autor:
Scott Overall, Sameer Kumar, Andrea Vittadini, Victoire Saby, Christopher R. Sharples, John Paul Rysavy, William Sharples, Clinton Miller
Publikováno v:
Fabricate 2020
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5a8439ca73793f5cda7f57750332ec63
https://doi.org/10.2307/j.ctv13xpsvw.17
https://doi.org/10.2307/j.ctv13xpsvw.17
Autor:
Scott Overall, William Sharples, Andrea Vittadini, Christopher R. Sharples, Victoire Saby, John Paul Rysavy, Clinton Miller, Sameer Kumar
Publikováno v:
Technology|Architecture + Design. 2:172-185
Automation in architectural design and documentation has often been a siloed process where discrete parts are scripted while other production is organized by analog documentation procedures. A made...
Autor:
Nick Novelli, Mohamed Aly, Christopher Morse, Scott Overall, Berardo Matalucci, Brandon Andow
Publikováno v:
Healthy, Intelligent and Resilient Buildings and Urban Environments.
Autor:
Jan P. Allebach, Rebecca Beth Silveston-Keith, Weibao Wang, George T.-C. Chiu, Travis Alan Riggs, Julie Ann Gordon Whitney, Gary Scott Overall
Publikováno v:
SPIE Proceedings.
Assessment of macro-uniformity is a capability that is important for the development and manufacture of printer products. Our goal is to develop a metric that will predict macro-uniformity, as judged by human subjects, by scanning and analyzing print
Autor:
Julie Ann Gordon Whitney, Xing Liu, Travis Alan Riggs, Jan P. Allebach, George T.-C. Chiu, Rebecca Beth Silveston-Keith, Gary Scott Overall
Publikováno v:
SPIE Proceedings.
Wavelets are a powerful tool that can be applied to problems in image processing and analysis. They provide a multi-scale decomposition of an original image into average terms and detail terms that capture the characteristics of the image at differen