Zobrazeno 1 - 10
of 34
pro vyhledávání: '"Scott Maclaren"'
Autor:
Antonio B. Mei, Angus Rockett, Chris Ferekides, Scott MacLaren, Vasilios Palekis, Mohit Tuteja, Allen Hall
Publikováno v:
The Journal of Physical Chemistry Letters. 7:4962-4967
The rear surfaces of CdTe photovoltaic devices without back contacts, grown by close-spaced sublimation (CSS), were analyzed using conductive atomic force microscopy (C-AFM). As-deposited and CdCl2-treated CdTe samples were compared to clarify the ef
Autor:
Angus Rockett, Scott MacLaren, Prakash Koirala, Robert W. Collins, Chris Ferekides, Vasilios Palekis, Mohit Tuteja
Publikováno v:
The Journal of Physical Chemistry C. 120:7020-7024
Device grade polycrystalline CdTe films, grown by rf-sputtering (yielding up to 13% efficient devices) and close-spaced sublimation (CSS) (yielding up to 16% efficient devices), have been analyzed using scanning microwave impedance microscopy (sMIM).
Publikováno v:
2017 IEEE 44th Photovoltaic Specialist Conference (PVSC).
The rear surfaces of CdTe photovoltaic devices without back contacts, grown by closed-space sublimation (CSS) were analyzed using conductive - atomic force microscopy (C-AFM). As-deposited and CdCl2treated CdTe samples were compared to clarify the ef
Publikováno v:
Journal of Applied Physics. 125:174303
Understanding carbon nanotubes (CNTs) based electronic devices requires strategies to characterize individual nanotube electronic properties. We will explore a new nonevasive approach to microwave impedance microscopy (MIM) which, we hypothesize, uti
Autor:
Mohit, Tuteja, Antonio B, Mei, Vasilios, Palekis, Allen, Hall, Scott, MacLaren, Chris S, Ferekides, Angus A, Rockett
Publikováno v:
The journal of physical chemistry letters. 7(24)
The rear surfaces of CdTe photovoltaic devices without back contacts, grown by close-spaced sublimation (CSS), were analyzed using conductive atomic force microscopy (C-AFM). As-deposited and CdCl
Autor:
Christos Ferekides, Prakash Koirala, Robert W. Collins, Vasilios Palekis, Scott MacLaren, Mohit Tuteja, Angus Rockett
Publikováno v:
2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC).
We present scanning microwave impedance microscopy as an analysis technique that can be used to map the relative carrier concentrations at the nanoscale in the semiconductors used for device applications. The specific application presented here is th
Autor:
Min-Feng Yu, Ivan Petrov, Steve Burdin, Daniel P. Abraham, Martin Bettge, Seung Yoon Ryu, Ernie Sammann, Scott MacLaren
Publikováno v:
Journal of Power Sources. 206:288-294
Hierarchical surface morphologies form when thin films are deposited onto preexisting templates of vertically aligned wires using a line-of-sight deposition method, providing a facile path to experimental battery electrodes with high surface-to-volum
Autor:
Ivan Petrov, Martin Bettge, Min-Feng Yu, Scott MacLaren, Daniel P. Abraham, Ernie Sammann, Steve Burdin
Publikováno v:
Journal of Materials Research. 26:2247-2253
A rich research history exists for crystalline growth by vapor–liquid–solid (VLS) methods, but not for amorphous growth. Yet VLS growth in the absence of crystallographic influences provides an ideal laboratory for exploring surface energy effect
Autor:
Sakulsuk Unarunotai, Dahl Young Khang, Congjun Wang, Scott MacLaren, J. A. N. T. Soares, Jeffrey S. Moore, John A. Rogers, C. H. Lei, Mitchell J. Schultz, Qing Cao, Xiaoyu Zhang, Ivan Petrov
Publikováno v:
Proceedings of the National Academy of Sciences. 105:7353-7358
Because of their potential for use in advanced electronic, nanomechanical, and other applications, large two-dimensional, carbon-rich networks have become an important target to the scientific community. Current methods for the synthesis of these mat