Zobrazeno 1 - 10
of 13
pro vyhledávání: '"Scott Lowrie"'
Autor:
Shaolei Quan, Freeman Zhong, Wing Liu, Pervez Aziz, Tai Jing, Jen Dong, Chintan Desai, Hairong Gao, Monica Garcia, Gary Hom, Tony Huynh, Hiroshi Kimura, Ruchi Kothari, Lijun Li, Cathy Liu, Scott Lowrie, Kathy Ling, Amaresh Malipatil, Ram Narayan, Tom Prokop, Chaitanya Palusa, Anil Rajashekara, Ashutosh Sinha, Charlie Zhong, Eric Zhang
Publikováno v:
2011 IEEE International Solid-State Circuits Conference.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e1d6adaaa14ba7193f561eb23dd0bde5
https://doi.org/10.1109/isscc.2011.5746348
https://doi.org/10.1109/isscc.2011.5746348
Publikováno v:
VLSI-SoC
AC coupling in a transmission link is preferred and often required for the functioning of high speed transceivers. But at data rate of 1OGbps and beyond, both the external AC coupling and the conventional on-chip AC coupling approaches bring in heavy
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3389e498593d6b0c0cccffd5c5f20d3a
https://doi.org/10.1109/vlsisoc.2007.4402477
https://doi.org/10.1109/vlsisoc.2007.4402477
Autor:
Han-Sheng Lee, David Scott Lowrie
Publikováno v:
Solid-State Electronics. 24:267-273
A computer simulated substrate response of an n -channel MOS floating gate transistor to a positive linear ramping gate voltage was investigated. Device parameters, such as the channel length, effective electron mobility, substrate doping level and t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6d0785d3bfd429a433d47ed659b93b58
https://doi.org/10.1016/0038-1101(81)90090-3
https://doi.org/10.1016/0038-1101(81)90090-3
Publikováno v:
In Microelectronics Reliability 1981 21(5):760-760
Autor:
Zhong, Freeman, Quan, Shaolei, Liu, Wing, Aziz, Pervez, Jing, Tai, Dong, Jen, Desai, Chintan, Gao, Hairong, Garcia, Monica, Hom, Gary, Huynh, Tony, Kimura, Hiroshi, Kothari, Ruchi, Li, Lijun, Liu, Cathy, Lowrie, Scott, Ling, Kathy, Malipatil, Amaresh, Narayan, Ram, Prokop, Tom
Publikováno v:
IEEE Journal of Solid-State Circuits; Nov2011, Vol. 46 Issue 12, p3126-3139, 14p
Publikováno v:
Journal of Failure Analysis & Prevention; Oct2003, Vol. 3 Issue 5, p81-88, 8p