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Autor:
Stephen Van Campen, R. Christopher Clarke, Jonathan Hawk, Robert M. Young, Harvey C. Nathanson, Robert S. Howell, Bettina Nechay, Eric J. Stewart, Eric M. Graves, Scott B. Miserendino, Timothy T. Braggins
Publikováno v:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 28:1060-1065
The authors demonstrate for the first time the injection of electrons across an n-type to p-type silicon junction and their subsequent tunneling from approximately 1 μm tall p-type silicon points into a vacuum gap. The diffusive flow of these minori