Zobrazeno 1 - 10
of 26
pro vyhledávání: '"Schwencker, R."'
Autor:
Streibl, M., Zängl, F., Esmark, K., Schwencker, R., Stadler, W., Gossner, H., Drüen, S., Schmitt-Landsiedel, D.
Publikováno v:
In Microelectronics Reliability 2005 45(2):313-321
Publikováno v:
2010 Design, Automation & Test in Europe Conference & Exhibition (DATE); 2010, p75-80, 6p
Autor:
Streibl, M., Zangl, F., Esmark, K., Schwencker, R., Stadler, W., Gossner, H., Druen, S., Schmitt-Landsiedel, D.
Publikováno v:
2003 Electrical Overstress/Electrostatic Discharge Symposium; 2003, p1-9, 9p
Autor:
Antreich, K., Eckmueller, J., Graeb, H., Pronath, M., Schenkel, F., Schwencker, R., Zizala, S.
Publikováno v:
Computer-Aided Design of Analog Integrated Circuits & Systems; 2002, p217-220, 4p
Publikováno v:
Computer-Aided Design of Analog Integrated Circuits & Systems; 2002, p718-723, 6p
Publikováno v:
Proceedings 2002 Design, Automation & Test in Europe Conference & Exhibition; 2002, p581-585, 5p
Publikováno v:
Proceedings of the Conference: Design, Automation & Test in Europe (9781581132441); Mar2000, p42-47, 6p
Autor:
Antreich, K., Eckmueller, J., Graeb, H., Pronath, M., Schenkel, F., Schwencker, R., Zizala, S.
Publikováno v:
Proceedings of the IEEE 2000 Custom Integrated Circuits Conference (Cat. No.00CH37044); 2000, p511-514, 4p
Publikováno v:
Proceedings Design, Automation & Test in Europe Conference & Exhibition 2000 (Cat. No. PR00537); 2000, p42-47, 6p
Publikováno v:
Design, Automation & Test in Europe Conference & Exhibition, 1999 Proceedings (Cat No PR00078); 1999, p323-327, 5p