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pro vyhledávání: '"Schutz, Laura"'
Publikováno v:
In Microelectronics Reliability 2005 45(1):47-56
Publikováno v:
Microelectronics Reliability. 45:47-56
In these experiments, we explored various methods of nitridation of thermal oxide. Rapid thermal oxidation (RTO), rapid thermal oxidation with nitric oxide (RTNO), remote plasma nitridation (RPN), and decoupled plasma nitridation (DPN) processes were
Autor:
Gambino, Jeff, Cooney, Ed, Murphy, Will, Luce, Cameron, Mongeon, Steve, Lai, Ning, Zwonik, Bob, Anderson, Felix, Schutz, Laura, Lee, Tom C., McDevitt, Tom
Publikováno v:
MRS Online Proceedings Library; 2010, Vol. 1249 Issue 1, p1-6, 6p
Autor:
Schutz L, Matinfar S, Schafroth G, Navab N, Fairhurst M, Wagner A, Wiestler B, Eck U, Navab N
Publikováno v:
IEEE transactions on visualization and computer graphics [IEEE Trans Vis Comput Graph] 2024 Sep 10; Vol. PP. Date of Electronic Publication: 2024 Sep 10.