Zobrazeno 1 - 10
of 38
pro vyhledávání: '"Schumacher, Zeno"'
In this work, we experimentally demonstrate two-state fluctuations in a metal-insulator-semiconductor (MIS) device formed out of a metallic atomic force microscopy tip, vacuum gap, and multilayer MoSe$_2$ sample. We show that noise in this device is
Externí odkaz:
http://arxiv.org/abs/2109.15275
Autor:
Plougmann, Rikke, Cowie, Megan, Benkirane, Yacine, Schué, Léonard, Schumacher, Zeno, Grütter, Peter
Transition metal dichalcogenides (TMDCs) have attracted significant attention for optoelectronic, photovoltaic and photoelectrochemical applications. The properties of TMDCs are highly dependent on the number of stacked atomic layers, which is usuall
Externí odkaz:
http://arxiv.org/abs/2109.05354
Autor:
Schumacher, Zeno, Rejali, Rasa, Cowie, Megan, Spielhofer, Andreas, Miyahara, Yoichi, Grutter, Peter
Inducing an inversion layer in organic semiconductors is a highly nontrivial, but critical, achievement for producing organic field-effect transistor (OFET) devices, which rely on the generation of inversion, accumulation, and depletion regimes for s
Externí odkaz:
http://arxiv.org/abs/2008.01562
Autor:
Schumacher, Zeno, Rejali, Rasa, Pachlatko, Raphael, Spielhofer, Andreas, Nagler, Philipp, Miyahara, Yoichi, Cooke, David G., Grütter, Peter
Publikováno v:
Proceedings of the National Academy of Sciences of the United States of America, 2020 Aug . 117(33), 19773-19779.
Externí odkaz:
https://www.jstor.org/stable/26968571
Atomic force microscopy (AFM) routinely achieves structural information in the sub-nm length scale. Measuring time resolved properties on this length scale to understand kinetics at the nm scale remains an elusive goal. We present a general analysis
Externí odkaz:
http://arxiv.org/abs/1609.02362
Publikováno v:
Phys. Rev. Applied 4, 054011 (2015)
We report a new experimental technique for Kelvin probe force microscopy (KPFM) using the dissipation signal of frequency modulation atomic force microscopy for bias voltage feedback. It features a simple implementation and faster scanning as it requ
Externí odkaz:
http://arxiv.org/abs/1508.05866
Akademický článek
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Akademický článek
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Autor:
Neb, Sergej, Shin, Dongbin, Schumacher, Zeno, Niedermayr, Arthur, Kuznetsov, Denis, Mueller, Christoph R., Fedorov, Alexey, Sato, Shunsuke A., Rubio, Ángel, Gallmann, Lukas, Keller, Ursula
Publikováno v:
Technical Digest Series
International Conference on Ultrafast Phenomena
International Conference on Ultrafast Phenomena
Attosecond transient absorption spectroscopy in two-dimensional functionalized transition metal carbide unveils ultrafast element, site, and carrier-specific electron-phonon relaxations on the few-femtosecond timescale and provides new insights towar
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7f2c5342e7f94e8bcd02a78f8441bd5c
https://doi.org/10.1364/up.2022.f1a.6
https://doi.org/10.1364/up.2022.f1a.6