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Autor:
Schulz, Steven E.
Publikováno v:
All Graduate Theses and Dissertations.
Three traverses across the exhumed trace of the Punchbowl fault zone in the 11 Pelona Schist, southern California, were examined at the millimeter to kilometer scales to determine the morphology, deformation mechanisms, and geochemistry of the fault
Externí odkaz:
https://digitalcommons.usu.edu/etd/6707
https://digitalcommons.usu.edu/cgi/viewcontent.cgi?article=7766&context=etd
https://digitalcommons.usu.edu/cgi/viewcontent.cgi?article=7766&context=etd
Autor:
Schulz, Steven E., Evans, James P. *
Publikováno v:
In Journal of Structural Geology 2000 22(7):913-930
Autor:
Schulz, Steven E.
Publikováno v:
All Graduate Theses and Dissertations
Three traverses across the exhumed trace of the Punchbowl fault zone in the 11 Pelona Schist, southern California, were examined at the millimeter to kilometer scales to determine the morphology, deformation mechanisms, and geochemistry of the fault
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2986f03b55099a132ea32757b30cb9d3
Autor:
Schulz, Steven E., Rahman, Khwaja M.
Publikováno v:
IEEE Transactions on Industry Applications. Jul/Aug2003, Vol. 39 Issue 4, p1118. 9p. 2 Black and White Photographs, 2 Diagrams, 10 Graphs.
Autor:
Rahman, Khwaja M., Schulz, Steven E.
Publikováno v:
IEEE Transactions on Industry Applications. Nov/Dec2002, Vol. 38 Issue 6, p1500. 8p. 2 Black and White Photographs, 2 Diagrams, 3 Graphs.
Autor:
Rahman, Khwaja M., Schulz, Steven E.
Publikováno v:
IEEE Transactions on Industry Applications. Jul/Aug2002, Vol. 38 Issue 4, p1062. 10p. 3 Black and White Photographs, 5 Diagrams, 1 Chart, 13 Graphs.
Autor:
Schulz, Steven E.1 steven.schulz@gm.com, Kowalewski, Daniel L.1 daniel.kowalewski@gm.com
Publikováno v:
IEEE Transactions on Vehicular Technology. May2007, Vol. 56 Issue 3, p1427-1433. 13p. 2 Black and White Photographs, 13 Graphs.
Autor:
Schulz, Steven E.
Publikováno v:
IEEE Electrification Magazine; 2017, Vol. 5 Issue: 1 p28-35, 8p
Publikováno v:
IEEE Transactions on Industry Applications; Jan/Feb2005, Vol. 41 Issue 1, p46-51, 6p