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pro vyhledávání: '"Schubert, Mathias M."'
Autor:
Kilic, Ufuk, Sekora, Derek, Mock, Alyssa, Korlacki, Rafal, Echeverria, Elena M., Ianno, Natale J., Franke-Schubert, Eva, Schubert, Mathias M.
Publikováno v:
Journal of Applied Physics 124, 115302 (2018)
WO3 thin films were grown by atomic layer deposition and spectroscopic ellipsometry data gathered in the photon energy range of 0.72-8.5 eV and from multiple samples was utilized to determine the frequency dependent complex-valued isotropic dielectri
Externí odkaz:
http://arxiv.org/abs/1805.04171
