Zobrazeno 1 - 10
of 268
pro vyhledávání: '"Schotland JC"'
Autor:
Li W; Department of Mathematical Sciences, DePaul University, Chicago, IL 60604., Schotland JC; Department of Mathematics and Department of Physics, Yale University, New Haven, CT 06511., Yang Y; Department of Computational Mathematics, Science and Engineering, Michigan State University, East Lansing, MI 48824., Zhong Y; Department of Mathematics and Statistics, Auburn University, Auburn, AL 36830.
Publikováno v:
SIAM journal on applied mathematics [SIAM J Appl Math] 2023 Apr; Vol. 83 (2), pp. 418-435.
Publikováno v:
Optics letters [Opt Lett] 2023 Mar 01; Vol. 48 (5), pp. 1232-1235.
Autor:
Markel VA, Schotland JC
Publikováno v:
Journal of the Optical Society of America. A, Optics, image science, and vision [J Opt Soc Am A Opt Image Sci Vis] 2022 Dec 01; Vol. 39 (12), pp. C179-C189.
Publikováno v:
Journal of the Optical Society of America. A, Optics, image science, and vision [J Opt Soc Am A Opt Image Sci Vis] 2022 Sep 01; Vol. 39 (9), pp. 1621-1633.
Publikováno v:
Optics letters [Opt Lett] 2020 Apr 01; Vol. 45 (7), pp. 1623-1626.
Publikováno v:
Journal of the Optical Society of America. A, Optics, image science, and vision [J Opt Soc Am A Opt Image Sci Vis] 2018 Nov 01; Vol. 35 (11), pp. 1855-1860.
Autor:
Florescu L; Centre for Vision, Speech and Signal Processing, University of Surrey, GU2 7XH, United Kingdom.; l.m.florescu@surrey.ac.uk., Markel VA; Department of Radiology, University of Pennsylvania, Philadelphia, PA 19104, United States of America.; vmarkel@pennmedicine.upenn.edu., Schotland JC; Department of Mathematics and Department of Physics, University of Michigan, Ann Arbor, MI 48109, United States of America.; schotland@umich.edu.
Publikováno v:
Inverse problems [Inverse Probl] 2018 Sep; Vol. 34 (9), pp. 094002. Date of Electronic Publication: 2018 Jul 11.
Publikováno v:
Optics letters [Opt Lett] 2018 Jun 15; Vol. 43 (12), pp. 3005-3008.
Autor:
Lien MB; Department of Electrical Engineering, University of Michigan , Ann Arbor, Michigan 48109, United States., Kim JY; Department of Materials Science and Engineering, University of Michigan , Ann Arbor, Michigan 48109, United States., Han MG; Condensed Matter Physics and Materials Sciences Department, Brookhaven National Laboratory , Upton, New York 11973, United States., Chang YC; Department of Physics, University of Michigan , Ann Arbor, Michigan 48109, United States., Chang YC; Department of Electrical Engineering, National Changhua University of Education , Changhua City 500, Taiwan., Ferguson HJ; Department of Electrical Engineering, University of Michigan , Ann Arbor, Michigan 48109, United States., Zhu Y; Condensed Matter Physics and Materials Sciences Department, Brookhaven National Laboratory , Upton, New York 11973, United States., Herzing AA; National Institute of Standards and Technology , Gaithersburg, Maryland 20899, United States., Schotland JC; Department of Mathematics, University of Michigan , Ann Arbor, Michigan 48109, United States., Kotov NA; Department of Materials Science and Engineering, University of Michigan , Ann Arbor, Michigan 48109, United States., Norris TB; Department of Electrical Engineering, University of Michigan , Ann Arbor, Michigan 48109, United States.
Publikováno v:
ACS nano [ACS Nano] 2017 Jun 27; Vol. 11 (6), pp. 5925-5932. Date of Electronic Publication: 2017 Jun 02.
Autor:
Hoskins JG; Department of Mathematics, University of Michigan, Ann Arbor, Michigan 48109, USA., Schotland JC; Department of Mathematics and Department of Physics, University of Michigan, Ann Arbor, Michigan 48109, USA.
Publikováno v:
Physical review. E [Phys Rev E] 2017 Mar; Vol. 95 (3-1), pp. 033002. Date of Electronic Publication: 2017 Mar 17.