Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Schmucker SW"'
Autor:
Owen JHG; Zyvex Labs, Richardson, TX, United States of America., Campbell Q; Sandia National Labs, Albuquerque, NM, United States of America., Santini R; Zyvex Labs, Richardson, TX, United States of America., Ivie JA; Sandia National Labs, Albuquerque, NM, United States of America., Baczewski AD; Sandia National Labs, Albuquerque, NM, United States of America., Schmucker SW; Sandia National Labs, Albuquerque, NM, United States of America., Bussmann E; Sandia National Labs, Albuquerque, NM, United States of America., Misra S; Sandia National Labs, Albuquerque, NM, United States of America., Randall JN; Zyvex Labs, Richardson, TX, United States of America.
Publikováno v:
Journal of physics. Condensed matter : an Institute of Physics journal [J Phys Condens Matter] 2021 Sep 01; Vol. 33 (46). Date of Electronic Publication: 2021 Sep 01.
Autor:
Schmucker SW; University of Maryland, College Park, Maryland 20742, USA., Namboodiri PN; National Institute of Standards & Technology, Gaithersburg, Maryland 20899, USA., Kashid R; National Institute of Standards & Technology, Gaithersburg, Maryland 20899, USA., Wang X; University of Maryland, College Park, Maryland 20742, USA., Hu B; University of Maryland, College Park, Maryland 20742, USA., Wyrick JE; National Institute of Standards & Technology, Gaithersburg, Maryland 20899, USA., Myers AF; National Institute of Standards & Technology, Gaithersburg, Maryland 20899, USA., Schumacher JD; National Institute of Standards & Technology, Gaithersburg, Maryland 20899, USA., Silver RM; National Institute of Standards & Technology, Gaithersburg, Maryland 20899, USA., Stewart MD Jr; National Institute of Standards & Technology, Gaithersburg, Maryland 20899, USA.
Publikováno v:
Physical review applied [Phys Rev Appl] 2019; Vol. 11.
Autor:
Wyrick J; Nanoscale Device Characterization Division , National Institute for Standards and Technology , Gaithersburg , Maryland 20899 , United States., Wang X; Nanoscale Device Characterization Division , National Institute for Standards and Technology , Gaithersburg , Maryland 20899 , United States., Namboodiri P; Nanoscale Device Characterization Division , National Institute for Standards and Technology , Gaithersburg , Maryland 20899 , United States., Schmucker SW; Nanoscale Device Characterization Division , National Institute for Standards and Technology , Gaithersburg , Maryland 20899 , United States., Kashid RV; Nanoscale Device Characterization Division , National Institute for Standards and Technology , Gaithersburg , Maryland 20899 , United States., Silver RM; Nanoscale Device Characterization Division , National Institute for Standards and Technology , Gaithersburg , Maryland 20899 , United States.
Publikováno v:
Nano letters [Nano Lett] 2018 Dec 12; Vol. 18 (12), pp. 7502-7508. Date of Electronic Publication: 2018 Nov 20.
Autor:
Rossi JE; Department of Chemical Engineering, Rochester Institute of Technology, Rochester, NY 14623, USA; NanoPower Research Laboratory, Rochester Institute of Technology, Rochester, NY 14623, USA., Soule KJ; Department of Chemical Engineering, Rochester Institute of Technology, Rochester, NY 14623, USA; NanoPower Research Laboratory, Rochester Institute of Technology, Rochester, NY 14623, USA., Cleveland E; National Research Council Post Doctoral Fellow, Residing at the U.S. Naval Research Laboratory, Washington, D.C. 20375, USA., Schmucker SW; National Research Council Post Doctoral Fellow, Residing at the U.S. Naval Research Laboratory, Washington, D.C. 20375, USA., Cress CD; National Research Council Post Doctoral Fellow, Residing at the U.S. Naval Research Laboratory, Washington, D.C. 20375, USA., Cox ND; Department of Chemical Engineering, Rochester Institute of Technology, Rochester, NY 14623, USA; NanoPower Research Laboratory, Rochester Institute of Technology, Rochester, NY 14623, USA; Department of Microsystems Engineering, Rochester Institute of Technology, Rochester, NY 14623, USA., Merrill A; Department of Chemical Engineering, Rochester Institute of Technology, Rochester, NY 14623, USA; NanoPower Research Laboratory, Rochester Institute of Technology, Rochester, NY 14623, USA., Landi BJ; Department of Chemical Engineering, Rochester Institute of Technology, Rochester, NY 14623, USA; NanoPower Research Laboratory, Rochester Institute of Technology, Rochester, NY 14623, USA. Electronic address: brian.landi@rit.edu.
Publikováno v:
Journal of colloid and interface science [J Colloid Interface Sci] 2017 Jun 01; Vol. 495, pp. 140-148. Date of Electronic Publication: 2017 Feb 02.
Autor:
Cress CD; Electronics Science and Technology Division, U.S. Naval Research Laboratory , Washington, DC 20375, United States., Schmucker SW; National Research Council, U.S. Naval Research Laboratory , Washington, DC 20375, United States., Friedman AL; Material Science and Technology Division, U.S. Naval Research Laboratory , Washington, DC 20375, United States., Dev P; National Research Council, U.S. Naval Research Laboratory , Washington, DC 20375, United States.; Department of Physics and Astronomy, Howard University , Washington, DC 20059, United States., Culbertson JC; Electronics Science and Technology Division, U.S. Naval Research Laboratory , Washington, DC 20375, United States., Lyding JW; Department of Electrical and Computer Engineering, and the Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign , Urbana, Illinois 61801, United States., Robinson JT; Electronics Science and Technology Division, U.S. Naval Research Laboratory , Washington, DC 20375, United States.
Publikováno v:
ACS nano [ACS Nano] 2016 Mar 22; Vol. 10 (3), pp. 3714-22. Date of Electronic Publication: 2016 Mar 03.
Autor:
Arnold HN, Cress CD; Electronics Science & Technology Division, U.S. Naval Research Laboratory , Washington, D.C. 20375, United States., McMorrow JJ, Schmucker SW; Electronics Science & Technology Division, U.S. Naval Research Laboratory , Washington, D.C. 20375, United States., Sangwan VK, Jaber-Ansari L, Kumar R, Puntambekar KP, Luck KA, Marks TJ, Hersam MC
Publikováno v:
ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2016 Mar 02; Vol. 8 (8), pp. 5058-64. Date of Electronic Publication: 2016 Feb 18.
Autor:
Robinson JT; Naval Research Laboratory, Washington, DC 20007, USA. jeremy.robinson@nrl.navy.mil, Schmucker SW, Diaconescu CB, Long JP, Culbertson JC, Ohta T, Friedman AL, Beechem TE
Publikováno v:
ACS nano [ACS Nano] 2013 Jan 22; Vol. 7 (1), pp. 637-44. Date of Electronic Publication: 2012 Dec 14.
Autor:
Schmucker SW; Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA. scott.schmucker@gmail.com, Kumar N, Abelson JR, Daly SR, Girolami GS, Bischof MR, Jaeger DL, Reidy RF, Gorman BP, Alexander J, Ballard JB, Randall JN, Lyding JW
Publikováno v:
Nature communications [Nat Commun] 2012 Jul 03; Vol. 3, pp. 935. Date of Electronic Publication: 2012 Jul 03.
Autor:
Wood JD; Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, United States., Schmucker SW, Lyons AS, Pop E, Lyding JW
Publikováno v:
Nano letters [Nano Lett] 2011 Nov 09; Vol. 11 (11), pp. 4547-54. Date of Electronic Publication: 2011 Oct 04.
Autor:
Xu Y; Department of Information Science and Electronic Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China. yangxu-isee@zju.edu.cn, He KT, Schmucker SW, Guo Z, Koepke JC, Wood JD, Lyding JW, Aluru NR
Publikováno v:
Nano letters [Nano Lett] 2011 Jul 13; Vol. 11 (7), pp. 2735-42. Date of Electronic Publication: 2011 Jun 10.