Model-Based Mutation Testing of an Industrial Measurement Device.

Autor: Aichernig, Bernhard K., Auer, Jakob, Jöbstl, Elisabeth, Korošec, Robert, Krenn, Willibald, Schlick, Rupert, Schmidt, Birgit Vera

Publikováno v: Tests & Proofs: 8th International Conference, TAP 2014, Held as Part of STAF 2014, York, UK, July 24-25, 2014. Proceedings; 2014, p1-19, 19p