Charge trapping by iodine ions in photorefractive Sn 2 P 2 S 6 crystals.

Autor: Scherrer EM; Department of Engineering Physics, Air Force Institute of Technology, Wright-Patterson Air Force Base, Ohio 45433, USA., Giles NC; Department of Engineering Physics, Air Force Institute of Technology, Wright-Patterson Air Force Base, Ohio 45433, USA., Dodson TER; Department of Engineering Physics, Air Force Institute of Technology, Wright-Patterson Air Force Base, Ohio 45433, USA., Grabar AA; Institute for Solid State Physics and Chemistry, Uzhhorod National University, 88000 Uzhhorod, Ukraine., Evans DR; Air Force Research Laboratory, Materials and Manufacturing Directorate, Wright-Patterson Air Force Base, Ohio 45433, USA., Basun SA; Air Force Research Laboratory, Materials and Manufacturing Directorate, Wright-Patterson Air Force Base, Ohio 45433, USA., Slagle JE; Air Force Research Laboratory, Materials and Manufacturing Directorate, Wright-Patterson Air Force Base, Ohio 45433, USA., Halliburton LE; Azimuth Corporation, 2970 Presidential Drive, Suite 200, Fairborn, Ohio 45324, USA.

Publikováno v: The Journal of chemical physics [J Chem Phys] 2020 Oct 14; Vol. 153 (14), pp. 144503.