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pro vyhledávání: '"Schalip, Ryan"'
Autor:
Roy, Anupam, Dey, Rik, Pramanik, Tanmoy, Rai, Amritesh, Schalip, Ryan, Majumder, Sarmita, Guchhait, Samaresh, Banerjee, Sanjay K
Publikováno v:
Phys. Rev. Materials 4, pp. 025001 (2020)
Chromium selenide thin films were grown epitaxially on Al${_2}$O${_3}$(0001) and Si(111)-(7${\times}$7) substrates using molecular beam epitaxy (MBE). Sharp streaks in reflection high-energy electron diffraction and triangular structures in scanning
Externí odkaz:
http://arxiv.org/abs/2003.01199
Akademický článek
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Autor:
Nibhanupudi, S. S. Teja, Roy, Anupam, Chowdhury, Sayema, Schalip, Ryan, Coupin, Matthew J., Matthews, Kevin C., Alam, Md Hasibul, Satpati, Biswarup, Movva, Hema C. P., Luth, Christopher J., Wu, Siyu, Warner, Jamie H., Banerjee, Sanjay K.
Publikováno v:
ACS Applied Materials & Interfaces; May 2024, Vol. 16 Issue: 17 p22326-22333, 8p
Autor:
Nibhanupudi SST; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States., Roy A; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States.; Department of Physics, Birla Institute of Technology Mesra, Ranchi, Jharkhand 835215, India., Chowdhury S; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States., Schalip R; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States., Coupin MJ; Texas Materials Institute, The University of Texas at Austin, Austin, Texas 78712, United States., Matthews KC; Texas Materials Institute, The University of Texas at Austin, Austin, Texas 78712, United States., Alam MH; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States., Satpati B; Surface Physics and Material Science Division, Saha Institute of Nuclear Physics, 1/AF, Bidhannagar, Kolkata 700 064, India., Movva HCP; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States., Luth CJ; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States., Wu S; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States., Warner JH; Texas Materials Institute, The University of Texas at Austin, Austin, Texas 78712, United States., Banerjee SK; Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78758, United States.
Publikováno v:
ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2024 May 01; Vol. 16 (17), pp. 22326-22333. Date of Electronic Publication: 2024 Apr 18.