Zobrazeno 1 - 10
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pro vyhledávání: '"Scanning confocal electron microscopy"'
Autor:
Richard Henderson, Timothy S. Baker
Publikováno v:
International Tables for Crystallography ISBN: 9780470660782
Burger's Medicinal Chemistry and Drug Discovery
Burger's Medicinal Chemistry and Drug Discovery
This chapter gives a complete but concise introduction to electron cryomicroscopy. The theoretical and practical background is discussed together with a review of applications to the three-dimensional structural analysis of biological macromolecules
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8bfe5d3087fd999e50c9843baa93e1b9
https://escholarship.org/uc/item/9tb0m9b8
https://escholarship.org/uc/item/9tb0m9b8
Autor:
V. Mennella
Publikováno v:
Encyclopedia of Cell Biology ISBN: 9780128216248
Structured illumination microscopy (SIM) is a fluorescence light microscopy method that relies on modulation of the excitation light by spatial patterning to break the diffraction barrier. SIM provides a resolution gain of only a factor of two, yet h
Externí odkaz:
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https://doi.org/10.1016/b978-0-12-821618-7.00116-4
https://doi.org/10.1016/b978-0-12-821618-7.00116-4
Autor:
Colin J. R. Sheppard
Microscopy using a scanning approach is reviewed, with numerous references to previous work, as at 1987, before the confocal laser scanning microscope was widely available commercially. The advantages of microscope imaging using a scanning technique
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4ed9141306d7d2d88ec2fa86387b4fe3
https://doi.org/10.1016/bs.aiep.2019.11.001
https://doi.org/10.1016/bs.aiep.2019.11.001
Publikováno v:
e-Journal of Surface Science and Nanotechnology. 16:247-252
Autor:
James Bowen, David Cheneler
Publikováno v:
Surfaces and Interfaces. 9:133-142
The use of scanning probe microscopy to acquire topographical information from surfaces with nanoscale features is now a common occurrence in scientific and engineering research. Image sizes can be orders of magnitude greater than the height of the f
Autor:
Manojit Pramanik, Paul Kumar Upputuri
Publikováno v:
Optics Communications. 404:32-41
The spatial resolution of a standard optical microscope (SOM) is limited by diffraction. In visible spectrum, SOM can provide ∼200nm resolution. To break the diffraction limit several approaches were developed including scanning near field microsco
Autor:
Dalibor Martišek, Jana Prochazkova
Publikováno v:
Measurement Science Review, Vol 17, Iss 6, Pp 273-281 (2017)
Measurement Science Review. 2017, vol. 17, issue 6, p. 273-281.
Measurement Science Review. 2017, vol. 17, issue 6, p. 273-281.
The 3D reconstruction of simple structured materials using a confocal microscope is widely used in many different areas including civil engineering. Nonetheless, scans of porous materials such as concrete or cement paste are highly problematic. The w
Autor:
Thomas Doneux, Laurent Bouffier
Publikováno v:
Current Opinion in Electrochemistry
Current Opinion in Electrochemistry, Elsevier, 2017, 6 (1), pp.31-37. ⟨10.1016/j.coelec.2017.06.015⟩
Current Opinion in Electrochemistry, Elsevier, 2017, 6 (1), pp.31-37. ⟨10.1016/j.coelec.2017.06.015⟩
Electrochemistry and fluorescence microscopy are two complementary transduction techniques that offer synergetic advantages when employed simultaneously. In particular, it is possible to study electrochemical reactivity by recording in situ fluoresce
Publikováno v:
Microscopy and Microanalysis. 23:1082-1090
Automated inclusion microanalysis in steel samples by computer-based scanning electron microscopy provides rapid quantitative information on micro-inclusion distribution, composition, size distribution, morphology, and concentration. Performing the a
Autor:
Joost W. M. Frenken, Irene M. N. Groot
Publikováno v:
MRS Bulletin
MRS Bulletin, 42(11), 834-841. Cambridge University Press
MRS Bulletin, 42(11), 834-841. Cambridge University Press (CUP): STM Journals-No Cambridge Open
MRS Bulletin, 42(11), 834-841. Cambridge University Press
MRS Bulletin, 42(11), 834-841. Cambridge University Press (CUP): STM Journals-No Cambridge Open
Scanning tunneling microscopy (STM) is an excellent technique to image the surfaces of materials with extreme spatial resolution. However, it is difficult to maintain its imaging quality when applying the technique under the conditions used in many p