Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Savithra Eratne"'
Publikováno v:
Journal of Low Power Electronics. 11:103-111
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5b9eee58026d4126d8c2e67b56416309
https://doi.org/10.1166/jolpe.2015.1373
https://doi.org/10.1166/jolpe.2015.1373
Publikováno v:
Journal of Low Power Electronics. 8:464-471
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::89b33e7bb8774ced28e37dac4b5ec5d6
https://doi.org/10.1166/jolpe.2012.1207
https://doi.org/10.1166/jolpe.2012.1207
Publikováno v:
MWSCAS
Thermal hotspots are a destructive phenomenon occurring in contemporary microprocessors. High power density of microprocessors and excessive use of certain microprocessor components by applications are considered the primary causes of increased tempe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5bf9fc4e7c6a83929a9eabb1306cf0d3
https://doi.org/10.1109/mwscas.2012.6292100
https://doi.org/10.1109/mwscas.2012.6292100
Publikováno v:
2010 53rd IEEE International Midwest Symposium on Circuits and Systems.
Technology scaling beyond the 65nm regime has resulted in leakage power consumption emerging as a major design constraint. Several methods aiming at mitigating leakage power have been studied and tested. These include power-rail gating, input vector
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::84c0223038221b9489be7e8d5a039f6d
https://doi.org/10.1109/mwscas.2010.5548678
https://doi.org/10.1109/mwscas.2010.5548678
Publikováno v:
2010 53rd IEEE International Midwest Symposium on Circuits and Systems.
Leakage power dissipation and stability continues to be a major concern in deep-submicron SRAM cell design. In this paper, a quasi-power-gating approach that reduces the leakage power dissipation in an SRAM cell while maintaining stability is propose
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9aa6b25e1cb3aa04370ef20e1973f5b1
https://doi.org/10.1109/mwscas.2010.5548705
https://doi.org/10.1109/mwscas.2010.5548705
Publikováno v:
2010 53rd IEEE International Midwest Symposium on Circuits and Systems.
Leakage is a growing issue with the advancements of technologies. It is a predominant problem of on chip caches of microprocessors. The cache is a major portion of the microprocessor area. Further, the SRAM cell is a significant contributor of transi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e0b322edc59abf0c2d30b56c1c688ecb
https://doi.org/10.1109/mwscas.2010.5548675
https://doi.org/10.1109/mwscas.2010.5548675
Autor:
Mahinda Alahakoon, Savithra Eratne
Publikováno v:
2009 International Conference on Industrial and Information Systems (ICIIS).
This paper presents a new, simple, lossless image transform with high speed, high energy compaction and low power for digital image compression. The proposed transform follows the Haar Wavelet Transform (HWT) using the hierarchical structure, with lo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cfdca264e53833ba9fd1f7d55e0a4701
https://doi.org/10.1109/iciinfs.2009.5429833
https://doi.org/10.1109/iciinfs.2009.5429833
Publikováno v:
APCCAS
Image processing for compression is an area that has been widely explored especially after microprocessors and modern digital networks which has enabled large traffic between various electronic components. Images have become the preferred form of com
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::45d9f779734596263d6dd73a2d304330
https://doi.org/10.1109/apccas.2008.4746030
https://doi.org/10.1109/apccas.2008.4746030
Publikováno v:
APCCAS
Full-adders are used extensively in most types of digital computing systems. Any design decision made at the full-adder level is likely to have a significant impact on the speed or power consumption of the entire digital system. In this paper, we stu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9afbad81e6c17f19d328b5a7e745045b
https://doi.org/10.1109/apccas.2008.4746186
https://doi.org/10.1109/apccas.2008.4746186