Zobrazeno 1 - 10
of 23
pro vyhledávání: '"Satyadev Ahlawat"'
Publikováno v:
Journal of Electronic Testing. 37:593-611
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::aca3653c8f6103e9d3a628be6e452de3
https://doi.org/10.1007/s10836-021-05978-6
https://doi.org/10.1007/s10836-021-05978-6
Publikováno v:
2022 IEEE 31st Asian Test Symposium (ATS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f32cf43768f146996f4837ad064b7253
https://doi.org/10.1109/ats56056.2022.00018
https://doi.org/10.1109/ats56056.2022.00018
Publikováno v:
2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c6ba592f8268cc9d7f9cc4c2e61bbf9c
https://doi.org/10.1109/vlsi-soc54400.2022.9939634
https://doi.org/10.1109/vlsi-soc54400.2022.9939634
Publikováno v:
2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f4b57e6071be17584fe283c2da186dec
https://doi.org/10.1109/iolts56730.2022.9897172
https://doi.org/10.1109/iolts56730.2022.9897172
Publikováno v:
2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ccdbe69f209d7d48885eaccfea7d1d0c
https://doi.org/10.1109/isvlsi54635.2022.00038
https://doi.org/10.1109/isvlsi54635.2022.00038
Publikováno v:
Proceedings of the Great Lakes Symposium on VLSI 2022.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::45317677230078660d481a5d10ab819a
https://doi.org/10.1145/3526241.3530370
https://doi.org/10.1145/3526241.3530370
Publikováno v:
2022 IEEE European Test Symposium (ETS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::00009b79af45c54fe0d8341b2f20673b
https://doi.org/10.1109/ets54262.2022.9810460
https://doi.org/10.1109/ets54262.2022.9810460
Publikováno v:
Communications in Computer and Information Science ISBN: 9783031215131
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::934799f05db14030d48dc8c1ad0a90a7
https://doi.org/10.1007/978-3-031-21514-8_48
https://doi.org/10.1007/978-3-031-21514-8_48
Publikováno v:
DFT
The strategies for breaking a cipher has been shifting towards side channel attacks which exploit the run-time physical attributes of cryptographic chips. Among the many such attacks, the scan-based attack has become a convenient approach for attacke
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::039e12370efbb22447b938e159fd6e03
https://doi.org/10.1109/dft.2019.8875355
https://doi.org/10.1109/dft.2019.8875355
Publikováno v:
IOLTS
Scan design-for-test (DfT) feature can be exploited as a side channel to break a cryptographic chip. The stringent test and diagnosis requirements of present-day complex system-on-chip (SoC) make use of the scan DfT feature unavoidable. However, bein
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ad9f5d75afc6979eef13268ff2a9d478
https://doi.org/10.1109/iolts.2019.8854411
https://doi.org/10.1109/iolts.2019.8854411