Zobrazeno 1 - 10
of 27
pro vyhledávání: '"Satoshi Hamaoka"'
Publikováno v:
Journal of Applied Physics; 2014, Vol. 116 Issue 8, p084311-1-084311-6, 6p, 4 Diagrams, 3 Graphs
Publikováno v:
Microsystem Technologies. 22:1181-1188
Design principles of lateral-deflection-controlled friction force microscopy (FFM) are presented. Lateral-deflection-controlled FFM can overcome a fundamental problem of dual-axis FFM and can provide higher lateral resolution by compensating for fric
Autor:
Yosuke Niimi, Tomoaki Sugino, Mitsuhiro Shikida, Kenji Fukuzawa, Tatsuya Hasegawa, Satoshi Hamaoka
Publikováno v:
Microsystem Technologies. 21:661-668
Mechanical strengthening of a Si cantilever by applying KOH wet etching was investigated. Two kinds of Si cantilever specimens having the different crystallographic orientations of the sidewall surfaces, i.e., Si{100} and Si{110}, were fabricated fro
Autor:
Kenji Fukuzawa, Shintaro Itoh, Hedong Zhang, Hiroaki Tsuji, Satoshi Hamaoka, Mitsuhiro Shikida
Publikováno v:
Microsystem Technologies. 19:1567-1572
It is important to understand friction force in micro/nano mechanical devices both at high sliding speed and with high lateral resolution. Dual-axis friction force microscopes that can provide high lateral resolution and accuracy have been proposed;
Autor:
Yosuke Niimi, Satoshi Hamaoka, Tomoaki Sugino, Kenji Fukuzawa, Mitsuhiro Shikida, Tatsuya Hasegawa
Publikováno v:
2013 IEEE SENSORS.
The effect of applying KOH wet etching on the fracture strength of a Si cantilever and the mechanism of its mechanical strengthening were investigated. Cantilever specimens with a sidewall surface of Si{100} or Si{110} were produced by a Bosch proces
Publikováno v:
Proceedings of JSME-IIP/ASME-ISPS Joint Conference on Micromechatronics for Information and Precision Equipment : IIP/ISPS joint MIPE. 2015:TuB-1
Publikováno v:
Journal of Applied Physics. 116:084311
Lateral-deflection-controlled dual-axis friction force microscopy (FFM) is presented. In this method, an electrostatic force generated with a probe-incorporated micro-actuator compensates for friction force in real time during probe scanning using fe
Publikováno v:
The Proceedings of Mechanical Engineering Congress, Japan. 2014:J1640204
Publikováno v:
The Proceedings of the Conference on Information, Intelligence and Precision Equipment : IIP. 2014:E-2
Autor:
Yosuke Niimi, Satoshi Hamaoka, Tomoaki Sugino, Mitsuhiro Shikida, Tatsuya Hasegawa, Kenji Fukuzawa
Publikováno v:
The Proceedings of Mechanical Engineering Congress, Japan. 2013:J212026-1