Zobrazeno 1 - 10
of 13
pro vyhledávání: '"Sassan Tabatabaei"'
Autor:
Sudhakar Pamarti, Vinod Menon, Carl Sechen, Kimo Joo, Joseph C. Doll, Sassan Tabatabaei, Meisam Heidarpour Roshan, Samira Zaliasl, Amanpreet Singh, Aaron Partridge, Nicholas Miller, Rajkumar Palwai, Lijun Will Chen, Carl Arft, Kamran Souri
Publikováno v:
IEEE Journal of Solid-State Circuits. 52:185-197
This paper presents a dual-microelectromechanical system (MEMS) resonator-based temperature sensor. In this sensor, the readout circuit estimates the temperature by measuring the frequency ratio of the two clocks generated by separate resonators with
Autor:
Sassan Tabatabaei, Pavan Gupta, Michael H. Perrott, Carl Arft, Jintae Kim, Sudhakar Pamarti, Aaron Partridge, Hae-Chang Lee, Fred Lee, Shouvik Mukherjee, Fari Assaderaghi, Niveditha Arumugam, James Christian Salvia
Publikováno v:
IEEE Journal of Solid-State Circuits. 48:276-291
MEMS-based oscillators offer a silicon-based alternative to quartz-based frequency references. Here, a MEMS-based programmable oscillator is presented which achieves better than ±0.5-ppm frequency stability from -40°C to 85°C and less than 1-ps (r
Autor:
Vinod Menon, Sassan Tabatabaei, Samira Zaliasl, Will Chen, Nicholas Miller, Joseph C. Doll, Kimo Joo, Kamran Souri, Aaron Partridge, Carl Arft, Sudhakar Pamarti, Carl Sechen, Rajkumar Palwai, Meisam Heidarpour Roshan
Publikováno v:
ISSCC
Precision MEMS oscillators require a temperature-to-digital converter (TDC) that adjusts the multiplication factor of a fractional-N PLL in order to compensate for the MEMS resonator's frequency variation over temperature [1]. This compensation, howe
Autor:
Sassan Tabatabaei, Aaron Partridge
Publikováno v:
IEEE Micro. 30:80-89
Recent advances in microelectromechanical system (MEMS) manufacturing and circuit design techniques have propelled MEMS-based silicon oscillators into the mainstream of electronic components. This article discusses the reasons for this trend, which i
Publikováno v:
Journal of Electronic Testing. 21:621-630
This paper extends the timing test model in [5] to be more realistic by including the effects of the test fixtures between a device under test and a tester. The paper enables analyzing the trade-offs that arise between the predicted yield and the req
Autor:
Aaron Partridge, Sassan Tabatabaei, Shouvik Mukherjee, Michael H. Perrott, Fred Lee, Jin-Tae Kim, Sudhakar Pamarti, Hae-Chang Lee, Jim Salvia, Pavan Gupta, Carl Arft, Niveditha Arumugam, Fari Assaderaghi
Publikováno v:
ISSCC
MEMS-based programmable oscillators have emerged as a promising alternative to crystal-based frequency references, with previously reported work demonstrating sub-ps integrated jitter [1]. Here we show frequency stability better than ±0.5ppm from
Autor:
Sassan Tabatabaei, Aaron Partridge
Publikováno v:
2009 IEEE Hot Chips 21 Symposium (HCS).
Publikováno v:
Journal of Electronic Testing; Dec2005, Vol. 21 Issue 6, p621-630, 10p
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