Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Sara Lampen"'
Autor:
Frank Pan, Sean C. Stuart, Adam G. Vore, Sara Lampen, John A. Hackwell, Peter D. Fuqua, James D. Barrie
Publikováno v:
Optical Interference Coatings Conference (OIC) 2022.
A novel hyperspectral imager design required a slit mask with bi-directional reflectance suppression between 600nm to 1650nm. A dark mirror coating was fabricated and patterned on a commercial off the shelf (COTS) edge filter.
Autor:
Sara Lampen, David W. Warren
Publikováno v:
SPIE Proceedings.
The Littrow form of spectrograph has a long and storied history in astronomical spectroscopy since its presentation in 1862 by Otto von Littrow. Light from an input slit traverses the same optical elements in reaching the dispersing element (prism or
Publikováno v:
SPIE Proceedings.
Previous works have shown the viability of using the Sine Condition Test (SCTest) to verify the alignment of optical systems. The SCTest uses the Abbe sine condition to measure the mapping between the entrance and exit pupils of an optical system. Fr
Publikováno v:
Applied optics. 50(34)
Rather than measuring aberrations across the field to quantify the alignment of an optical system, we show how a single, on-axis measurement of the pupil mapping can be used to measure the off-axis performance of the system and determine the state of
Publikováno v:
SPIE Proceedings.
An experimental test for violations of the sine condition is presented. This test is particularly useful for identifying the state of alignment of an imaging system because it provides a direct measurement of the linear astigmatism (astigmatism that
Publikováno v:
Novel Optical Systems Design and Optimization XIV.
Imaging aberrations that have linear dependence on field angle are caused by pupil aberrations that can be described using the Abbe sine condition. This well-known relationship is frequently used to guide the design of optical imaging systems. For ex
Publikováno v:
Applied Optics. 52:8518
Publikováno v:
Applied Optics. 52:7099
By taking a new look at an old concept, we have shown in our previous work how the Abbe sine condition can be used to measure linearly field-dependent aberrations in order to verify the alignment of optical systems. In this paper, we expand on this m