Zobrazeno 1 - 10
of 21
pro vyhledávání: '"Sanjeev Manhas"'
Autor:
Ankit Gaurav, Xiaoyao Song, Sanjeev Manhas, Aditya Gilra, Eleni Vasilaki, Partha Roy, Maria Merlyne De Souza
Publikováno v:
Frontiers in Electronics, Vol 3 (2022)
The processing of sequential and temporal data is essential to computer vision and speech recognition, two of the most common applications of artificial intelligence (AI). Reservoir computing (RC) is a branch of AI that offers a highly efficient fram
Externí odkaz:
https://doaj.org/article/e2d4e7036d1141b2825bdb6577ab7ce6
Publikováno v:
Communications in Computer and Information Science ISBN: 9783031215131
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2d564fb84275cc2c27dc8fca7c3cb422
https://doi.org/10.1007/978-3-031-21514-8_21
https://doi.org/10.1007/978-3-031-21514-8_21
This book is a collection of selected peer-reviewed papers presented at the International Conference on Signal Processing and Communication (ICSC 2018). It covers current research and developments in the fields of communications, signal processing, V
Publikováno v:
International Journal of Electronics and Electrical Engineering. :50-55
This paper presents a novel design of switch capacitor DAC successive approximation analog to digital converter (SAR-ADC) using regulated clocked current mirrors. The regulated clocked current mirror (RCCM) design is introduced to source (and sink) t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5df605a16b56799c56c9451b617a83e7
https://doi.org/10.12720/ijeee.2.1.50-55
https://doi.org/10.12720/ijeee.2.1.50-55
Publikováno v:
Applied Physics Letters; 2/20/2023, Vol. 122 Issue 8, p1-6, 6p
Publikováno v:
Japanese Journal of Applied Physics; May2022, Vol. 61 Issue SC, p1-7, 7p
Publikováno v:
RSC Advances; 1/5/2021, Vol. 11 Issue 2, p798-806, 9p
Publikováno v:
IEEE Electron Device Letters; Dec2020, Vol. 41 Issue 12, p1715-1745, 31p
Autor:
Kumar Sharma, Deepak, Datta, Arnab
Publikováno v:
IEEE Transactions on Device & Materials Reliability; Sep2020, Vol. 20 Issue 3, p512-516, 5p
Publikováno v:
Journal of Electronic Materials; Dec2019, Vol. 48 Issue 12, p7674-7679, 6p