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pro vyhledávání: '"Sani Irwan Salim"'
Autor:
Anuar Jaafar, Norhayati Soin, Sharifah F. Wan Muhamad Hatta, Sani Irwan Salim, Zahriladha Zakaria
Publikováno v:
Applied Sciences, Vol 11, Iss 14, p 6417 (2021)
The degradation effect of a field-programmable gate array becomes a significant issue due to the high density of logic circuits inside the field-programmable gate array. The degradation effect occurs because of the rapid technology scaling process of
Externí odkaz:
https://doaj.org/article/347d09c758d341339892eb9fd361bd79
