Early-Stage Reliability Evaluation of Passivation Stack and Termination Designs in SiC MPS Diodes

Autor: Momeni, Davood, Mazzillo, Massimo, Laha, Sibasish, Sani, M. Sazrin B. Abd., Urresti, Jesus, Dai, Tian Xiang, Liguda, Christian, Habenicht, Soenke

Publikováno v: Diffusion and Defect Data Part B: Solid State Phenomena; August 2024, Vol. 361 Issue: 1 p33-38, 6p