Zobrazeno 1 - 10
of 12
pro vyhledávání: '"Sangjae Park"'
Autor:
Sangjae Park, Jungrae Kim
Publikováno v:
IEEE Access, Vol 10, Pp 78970-78982 (2022)
As process scaling continues, DRAM is getting more vulnerable to errors. System companies and DRAM vendors have introduced ECC to protect DRAM against growing errors. ECC, however, should be combined with a repair mechanism to prevent non-transient f
Externí odkaz:
https://doaj.org/article/e330848fd99845d4a3aa762a12761c34
Publikováno v:
IEEE Access, Vol 10, Pp 89769-89780 (2022)
Shrinking process technology and rising memory densities have made memories increasingly vulnerable to errors. Accordingly, DRAM vendors have introduced On-die Error Correction Code (O-ECC) to protect data against the growing number of errors. Curren
Externí odkaz:
https://doaj.org/article/fd8a83298ad44620bdfacc4c2baff627
Autor:
Jungrae Kim, Sangjae Park
Publikováno v:
IEEE Access. 10:78970-78982
Publikováno v:
Transaction of the Korean Society of Automotive Engineers. 27:361-368
Publikováno v:
Transactions of the Korean Society of Mechanical Engineers - B. 41:835-841
Publikováno v:
The Journal of Korean Institute of Information Technology. 15:135-142
Publikováno v:
Fuel. 187:146-158
In the present research, macroscopic spray visualization tests were carried out in a constant-volume combustion chamber (CVCC) under replicated ambient conditions of a stratified combustion mode, in order to achieve stable stratified combustion with
Publikováno v:
SAE Technical Paper Series.
Publikováno v:
SAE Technical Paper Series.
Publikováno v:
Fuel. 286:119362
As emission regulations for vehicles have become stricter, the survival of direct injection technologies has been threatened due to increased particle emissions. By many researchers, there has been the effort to reduce the particle emissions. Nonethe