Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Sangeetha, Yalamanchili"'
Autor:
Raju Deepak Potnuru, Sangeetha Yalamanchili, Likhitha Portigadda, Tejaswini Tata, Pavan Burada
Publikováno v:
2023 International Conference on Innovative Data Communication Technologies and Application (ICIDCA).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::56859ce1b87aad83c5b0a59b9e5c8fc9
https://doi.org/10.1109/icidca56705.2023.10100011
https://doi.org/10.1109/icidca56705.2023.10100011
Autor:
Umapathi, K.1 (AUTHOR), Sangeetha, Yalamanchili2 (AUTHOR), Shankar, A. N.3 (AUTHOR), Vidhyalakshmi, P.4 (AUTHOR), Ramkumar, R.5 (AUTHOR), Balakumar, S.6 (AUTHOR), Magdalinmary, D.7 (AUTHOR)
Publikováno v:
Advances in Materials Science & Engineering. 6/22/2021, p1-13. 13p.
Autor:
Sangeetha, Yalamanchili, Majji, Sankararao, Srinagesh, Ayyagari, Patnala, Tulasi Radhika, Nalajala, Sunanda, Prathap, Boppuru Rudra
Publikováno v:
Applied Nanoscience; Feb2023, Vol. 13 Issue 2, p1055-1064, 10p
Akademický článek
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Autor:
Sangeetha Yalamanchili
Publikováno v:
International Journal of Recent Technology and Engineering. 8:1053-1057
Software defect prediction analysis is an important problem in the software engineering community. Software defect prediction can directly affect the quality and has achieved significant popularity in the last few years. This software prediction anal
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4228f81d256923f659b1b0d39f382471
https://doi.org/10.35940/ijrte.b1178.0982s1119
https://doi.org/10.35940/ijrte.b1178.0982s1119
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
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Publikováno v:
2016 International Conference on Signal Processing, Communication, Power and Embedded System (SCOPES).
Testing is one of the vital activities which must be performed during the software development mainly intent to find the errors according to customer requirement. The purpose of Information Handling for improving software reliability is to provide be
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0e58e50bc4f44fe494dd40c83a00af55
https://doi.org/10.1109/scopes.2016.7955752
https://doi.org/10.1109/scopes.2016.7955752
Publikováno v:
2014 International Conference on Circuits, Power & Computing Technologies [ICCPCT-2014]; 2014, p1-28, 28p
Publikováno v:
2014 International Conference on Circuits, Power & Computing Technologies [ICCPCT-2014]; 2014, p1-28, 28p
Publikováno v:
2014 International Conference on Circuits, Power & Computing Technologies [ICCPCT-2014]; 2014, p1-28, 28p